- Astera Labs is seeking a Manager, ATE Test Engineering to lead our Test engineering organization in San Jose, CA
- This is a critical leadership role responsible for driving next-generation high-speed, high-performance products from silicon bring-up through high-volume manufacturing in advanced process nodes
- Astera Labs is looking to build and scale the Test Engineering team responsible for developing scalable ATE solutions for complex mixed-signal silicon products and high-speed products that power next-generation AI infrastructure
- You will shape test strategy, guide execution across wafer sort and final test, and ensure products move confidently from design through silicon bring-up and high-volume production
- This is an opportunity to combine technical depth with engineering leadership at a hyper-growth connectivity company. Your decisions will directly influence product quality, manufacturing readiness, and customer experience
- You will partner across design, DFT, product engineering, operations, and manufacturing to improve coverage, quality, cost, and test time as Astera Labs scales purpose-built connectivity for rack-scale AI systems
- Team Leadership & Organization Building:
- Build, mentor, and lead a high-performing team of ATE Test engineers owning a diverse portfolio of connectivity products purpose-built for AI infrastructure
- Establish scalable processes, best-known methods (BKMs), and operational excellence frameworks as the organization grows
- Make sound technical and organizational decisions in a fast-paced, dynamic environment with competing priorities
- Test Strategy and Product Ownership:
- Define end-to-end ATE test strategies and plans for high-speed connectivity products from design engagement through high-volume production
- Establish coverage, quality, test-time, cost, and yield objectives, and drive measurable improvements across the product lifecycle
- Lead silicon and ATE bring-up, bench-to-ATE correlation, production release, and ongoing test optimization
- ATE Hardware, Software, and Silicon Validation:
- Guide to tester platform selection and development of load boards, interface hardware, and test solutions for wafer sort and final test
- Direct ATE program development, pattern implementation, debug, and resource optimization on Advantest 93k or Teradyne platforms
- Drive characterization and production test of high-speed SerDes and mixed-signal interfaces, including PCIe, Ethernet, DDR, NVMe, and USB
- Partner with DFT and design teams to implement SCAN, MBIST, SerDes, and functional test methods that maximize defect and parametric coverage
- Cross-Functional Leadership and Manufacturing Execution:
- Build alignment with design, DFT, product engineering, operations, and external manufacturing partners on readiness, risk, and release decisions
- Develop technical talent, set priorities, and create a culture of ownership, rigorous execution, and continuous improvement
- Use data from production, lab equipment, protocol analyzers, oscilloscopes, and manufacturing systems to resolve issues and improve product quality
Benefits
- Flexible time off in the US
- Parental leave
- 401K
- Retirement and pension plans
- Competitive medical, dental and vision plans
Bachelor’s degree in electrical engineering or related technical field3+ years of managerial experience building and leading Test engineering teamAbility to communicate clearly, manage competing priorities, and partner effectively across technical and manufacturing organizationsWorking knowledge of high-speed protocols and physical-layer behavior, including PCIe, Ethernet, DDR, NVMe, or USB8+ years of experience developing and supporting ATE test solutions for complex High-speed products or SoC productsExperience with ATE program development, silicon bring-up, bench-to-ATE correlation, production debug, and test-time optimizationMaster’s or PhD in Electrical Engineering or related fieldExperience leading wafer-sort and final-test hardware development, including high-speed load-board designStrong knowledge of DFT techniques such as SCAN, MBIST, SerDes, and functional test, plus control interfaces including I2C, I3C, SPI, MDIO, and JTAGExperience testing high-speed SerDes operating at 16 Gbps or higher, including external loopback at wafer sortProficiency in C/C++ or Python for ATE programming, data processing, and automation; familiarity with modern databases and RF testing on ATE platformsDemonstrated ability to develop engineers, influence cross-functional decisions, and deliver results in a fast-paced, high-growth environment