Senior Electron Microscopy Engineer - Laser Failure Analysis

AOI; Houston (TX); On-site; USD 120,000 - 170,000; Full time

Benefits offered by this job

Relocation package within US

Immigration sponsorships

Flexible health plans

401(k) matching

Generous PTO

Job summary

Applied Optoelectronics, Inc. in Houston, TX is seeking a Senior Electron Microscopy Engineer to drive failure analysis and yield improvement through advanced EM techniques. You will lead FIB/SEM/EDX/TEM work, develop cross-sectional TEM lamellae, and correlate defects with processing and device performance.

The role requires a Ph.D. with multiple years of industrial EM experience, hands-on expertise in plan-view TEM, and strong collaboration with engineering teams to enable root-cause analysis

Qualifications

• Ph.D. with 5+ years industrial experience or equivalent.
• Recognized expertise in advanced electron microscopy and plan-view lamellae.
• Strong crystallography and defect-formation knowledge.
• Experience with semiconductor laser materials and processing a plus.

Responsibilities

• Perform advanced EM analysis to identify defects, interfaces, and failure mechanisms.
• Develop site-specific cross-sectional TEM lamella and plan-view TEM prep methods.
• Analyze crystallographic defects and relate findings to formation mechanisms.
• Correlate microscopy with epitaxy, devices, and reliability data for root-cause analysis.
• Oversee lab operations, methods, SOPs, and staff training.
• Collaborate with Process Engineering, Epitaxy, Yield, Reliability, and R&D teams.
• Work with vendors/universities to advance microscopy capabilities.
• Prepare technical reports and present results and recommendations.

Skills

Advanced electron microscopy

FIB

SEM

EDX/EDS

TEM/STEM

HRTEM

Electron diffraction

Plan-view TEM specimens

Cross-sectional lamellae

Education

Ph.D. in Materials Science, Physics, Electrical Engineering, or related field

Tools

Plan-view TEM lamellae preparation

Job description

Applied Optoelectronics, Inc. in Houston, TX is seeking a Senior Electron Microscopy Engineer to drive failure analysis and yield improvement through advanced EM techniques. You will lead FIB/SEM/EDX/TEM work, develop cross-sectional TEM lamellae, and correlate defects with processing and device performance.

The role requires a Ph.D. with multiple years of industrial EM experience, hands-on expertise in plan-view TEM, and strong collaboration with engineering teams to enable root-cause analysis