Senior Electron Microscopy Engineer for Laser Defects

Instruct-ERIC; Sugar Land (TX); On-site; USD 120,000 - 180,000; Full time

Job summary

Applied Optoelectronics, Inc. (AOI) seeks a Senior Electron Microscopy Engineer to support semiconductor laser failure analysis, process troubleshooting, and yield improvement.

The candidate will be an expert in FIB, SEM, EDX/EDS, TEM/STEM, HRTEM, and electron diffraction, with strong capabilities in advanced sample preparation and defect analysis. Responsibilities include developing FIB methods, correlating microscopy with epitaxy and device performance, overseeing lab operations, training

Qualifications

• PhD with 5+ years of industrial experience or equivalent.
• Expertise in advanced electron microscopy with hands-on FIB sample prep.
• Strong knowledge of crystallography and semiconductor defects and their origins.
• Experience with semiconductor laser devices, epitaxy, and related processes preferred.

Responsibilities

• Perform advanced electron microscopy analysis to identify defects, interfaces, and failure mechanisms.
• Develop advanced FIB sample-preparation methods for TEM lamella and plan-view prep.
• Analyze crystallographic and process-induced defects and their formation mechanisms.
• Correlate microscopy results with epitaxy, wafer fabrication, device performance and yield data.
• Oversee microscopy lab operations, equipment performance, and sample-preparation capabilities.
• Develop SOPs and train technicians and engineers in microscopy operation, sample preparation, and data interpretation.
• Collaborate with Process Engineering, Epitaxy, Yield, Reliability, Quality, and R&D teams.
• Work with equipment vendors, universities, and external laboratories to expand analytical capability.
• Prepare technical reports and clearly present analysis results to technical teams and management.

Skills

FIB

SEM

TEM/STEM

EDX/EDS

HRTEM

Electron diffraction

Lab operations

Education

PhD in Materials Science/Physics/EE

Tools

FIB instrument

SEM instrument

TEM/STEM instruments

Job description

Applied Optoelectronics, Inc. (AOI) seeks a Senior Electron Microscopy Engineer to support semiconductor laser failure analysis, process troubleshooting, and yield improvement.

The candidate will be an expert in FIB, SEM, EDX/EDS, TEM/STEM, HRTEM, and electron diffraction, with strong capabilities in advanced sample preparation and defect analysis. Responsibilities include developing FIB methods, correlating microscopy with epitaxy and device performance, overseeing lab operations, training