Senior ATE Test Engineer - Silicon Yield & Automation

Advanced Micro Devices

Austin (TX)

On-site

USD 120,000 - 150,000

Full time

14 days+
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Job summary

Advanced Micro Devices in Austin, TX is seeking a Test Engineering professional to impact quality, yield, and time-to-market for AMD microprocessors. You will develop ATE test patterns, perform post-silicon characterization, and collaborate with Design and Platform Engineering to improve tests across the product lifecycle.

The role emphasizes root-cause analysis, data-driven decisions, and scalable test automation, with opportunities to influence future test strategies while maintaining cost and

Qualifications

  • Hands-on ATE test experience; Advantest V93K SMT8 preferred.
  • Experience with SCAN, BIST, and functional ATE test pattern debug and characterization.
  • Unix and Windows proficiency.
  • Experience with AI and developing skills/agents.
  • Semiconductor industry experience with design, architecture, or test flows.

Responsibilities

  • Develop and debug Automated Test Equipment (ATE) test patterns and flows.
  • Complete post-silicon characterization and enable internal/external validation.
  • Optimize product cost structure and test infrastructure.
  • Collaborate with design and HW teams to define production test specs.
  • Mentor team members and develop scalable test infrastructure.

Skills

ATE testing
Root cause analysis
Data analysis
Cross-functional teamwork
Problem solving

Education

B.S. in Electrical/Computer Engineering

Tools

Advantest V93K SMT8
SCaN
BIST
Unix/Windows familiarity

Job description

Advanced Micro Devices in Austin, TX is seeking a Test Engineering professional to impact quality, yield, and time-to-market for AMD microprocessors. You will develop ATE test patterns, perform post-silicon characterization, and collaborate with Design and Platform Engineering to improve tests across the product lifecycle.

The role emphasizes root-cause analysis, data-driven decisions, and scalable test automation, with opportunities to influence future test strategies while maintaining cost and

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