Principal SI Engineer — Pathfinding for High‑Speed I/O

Micron Technology; San Jose (CA); On-site; USD 119,000 - 320,000; Full time

Job summary

Micron Technology is seeking a Principal Signal Integrity Engineer to advance high‑speed interface solutions for memory and die‑to‑die interfaces. You will own interconnect models, perform forward‑looking SI analyses, and collaborate across SI, circuit and packaging teams to drive design rules and link budgets.

The role emphasizes original analysis over established playbooks, with a small, senior team and impact on pre‑silicon predictions. A US base salary range is provided and benefits.

Qualifications

• MS or PhD required in Electrical Engineering; hands-on modeling and simulation essential.

Responsibilities

• Develop and validate interconnect models from field solver extraction through time- and frequency-domain circuit simulation.
• Lead SI assessment of substrate and packaging technologies, translating physical characteristics into channel performance projections.
• Drive SI analysis during pathfinding studies, including I/O and channel co-optimization; guide other teams as needed.
• Define and champion progressive design rules for package and system-level performance; establish forward-looking budgets and simulations.

Skills

SI/PI experience

Electromagnetic theory

Time/frequency domain sim

Solver tools: HFSS/Q3D

Hardware measurement tools

Communication skills

Education

MS or PhD in Electrical Engineering

Tools

ADS

HSPICE

SPECTRE

HFSS

Q3D

SIWAVE

Job description

Micron Technology is seeking a Principal Signal Integrity Engineer to advance high‑speed interface solutions for memory and die‑to‑die interfaces. You will own interconnect models, perform forward‑looking SI analyses, and collaborate across SI, circuit and packaging teams to drive design rules and link budgets.

The role emphasizes original analysis over established playbooks, with a small, senior team and impact on pre‑silicon predictions. A US base salary range is provided and benefits.