Postdoctoral Fellow (PREP0004225)

Johns Hopkins University; Gaithersburg (MD); On-site; USD 60,000 - 80,000; Full time

Job summary

Johns Hopkins University in Gaithersburg seeks a Research Associate for the NIST CHIPS project, focusing on advanced X-ray metrology methods to characterize nanometer-scale thin films. Qualified candidates will conduct research, publish findings, and present at conferences.

Applicants must possess a Ph.D. in a relevant field and have experience with X-ray measurement techniques. Strong communication skills are also essential. Join a team that promotes scientific excellence and equal opportunity.

Qualifications

• Ph.D. is required in a relevant scientific discipline.
• Experience with X-ray reflectivity, fluorescence, or photoelectron spectroscopy is essential.
• Familiarity with clean-room protocols is preferred.

Responsibilities

• Plan and conduct research on thin films using advanced X-ray metrology.
• Characterize structural properties through various methods.
• Publish results in scientific journals.

Skills

X-ray measurement technique(s)

Programming using Python

Strong oral and written communication skills

Education

Ph.D. in physics, materials science, or a related field

Job description

PREP Research Associate

CHIPS Funded Project.

Research Title: Nanometer-Scale Planar Reference Materials (U.S. Citizens Preferred)

The Material Measurement Laboratory of the National Institute of Standards and Technology (NIST) seeks qualified individuals (U.S. Citizens preferred) to join the NIST/CHIPS Nanometer-Scale Planar Reference Materials project. The role involves advanced metrology methods to characterize local physical and chemical properties and map variations in thin, nanometer‑scale films deposited on Si and SiC wafers.

Key Responsibilities

• Plan and conduct research on advanced X‑ray metrology to determine the structural (physical and chemical) properties of blanket (non‑patterned) thin films on Si and SiC wafers.
• Use lab‑based and synchrotron X‑ray characterization methods to determine structural properties of thin film samples.
• Use open‑source (Python) fitting methods to constrain structural models, determine uncertainties, and combine these properties into a hybrid metrology digital wafer.
• Perform wafer dicing, cleaning, and packaging of samples for distribution as research‑grade test materials.
• Publish results in archival scientific journals and present results at topical meetings.

Qualifications

• Ph.D. in physics, materials science, or a related field.
• Background in X‑ray measurement technique(s) (X‑ray reflectivity, X‑ray fluorescence, or X‑ray photoelectron spectroscopy) required.
• Background in programming and/or data modeling using Python recommended.
• Familiarity with thin‑film deposition and clean‑room access protocols preferred.
• Strong oral and written communication skills.

Equal Opportunity Employer

The Johns Hopkins University is committed to equal opportunity for its faculty, staff, and students and does not discriminate on the basis of sex, gender, marital status, pregnancy, race, color, ethnicity, national origin, age, disability, religion, sexual orientation, gender identity or expression, veteran status, or other legally protected characteristics.

EEO is the Law: The U.S. Equal Employment Opportunity Commission provides resources and guidance on employment rights and anti-discrimination laws.