Postdoctoral Fellow (PREP0004225)

Johns Hopkins University; Baltimore (MD); On-site; USD 70,000 - 90,000; Full time

Benefits offered by this job

Health and life insurance

Career development opportunities

Retirement plans

Job summary

Johns Hopkins University seeks a PREP Research Associate to conduct cutting-edge research on X-ray metrologies for thin films. The ideal candidate will hold a Ph.D. in physics or materials science and possess strong programming skills in Python. Responsibilities include planning and executing research, characterizing materials, and publishing results in scientific journals.

This role offers participation in significant scientific collaboration with opportunities for professional growth within the NIST program. Applicants with familiarity in thin film deposition and solid communication skills will excel in this position.

Qualifications

• Ph.D. in physics, materials science, or a related field.
• Experience with X-ray reflectivity, fluorescence, or photoelectron spectroscopy.
• Background in programming and data modeling using Python.
• Familiarity with thin film deposition and clean room protocols.

Responsibilities

• Plan and conduct research on X-ray metrologies for thin films.
• Use lab and synchrotron X-ray methods for characterization.
• Utilize Python for structural model fitting and uncertainty analysis.
• Perform wafer dicing and cleaning for research materials.
• Publish findings in scientific journals and present at meetings.

Skills

X-ray measurement techniques

Programming in Python

Communication skills

Education

Ph.D. in physics, materials science, or related field

Job description

PREP Research Associate – CHIPS Funded Project

Nanometer-Scale Planar Reference Materials (U.S. Citizens Preferred)

This position is part of the National Institute of Standards and Technology (NIST) Professional Research Experience Program (PREP). The Prep program involves staff from a wide range of backgrounds conducting scientific research across various fields. Individuals in this position will perform technical work supporting the collaboration’s scientific research.

Key Responsibilities

• Plan and conduct research on advanced X‑ray metrologies to determine structural (physical and chemical) properties of blanket (non‑patterned) thin films on Si and SiC wafers.
• Use lab‑based and synchrotron X‑ray characterization methods to determine the structural properties of thin film samples.
• Use open‑source (Python) fitting methods to constrain structural models, determine uncertainties, and combine these properties into a hybrid metrology digital wafer.
• Perform wafer dicing, cleaning, and packaging of samples for distribution as research‑grade test materials.
• Publish results in archival scientific journals and present results at topical meetings.

Qualifications

• Ph.D. in physics, materials science, or a related field.
• Background in X‑ray measurement technique(s) such as X‑ray reflectivity, X‑ray fluorescence, or X‑ray photoelectron spectroscopy.
• Background in programming and/or data modeling using Python.
• Familiarity with thin film deposition and clean room access protocols is preferred.
• Strong oral and written communication skills.

Salary and Benefits

Salary Range: The referenced salary range represents the minimum and maximum salaries for this position and is based on Johns Hopkins University's good faith belief at the time of posting. The actual compensation offered may vary based on multiple factors.

Total Rewards: Johns Hopkins offers a total rewards package that supports employees’ health, life, career and retirement.

Equal Opportunity Employer

Johns Hopkins University is committed to equal opportunity for its faculty, staff, and students. The university does not discriminate on the basis of sex, gender, marital status, pregnancy, race, color, ethnicity, national origin, age, disability, religion, sexual orientation, gender identity or expression, veteran status or other legally protected characteristics.

To that end, the university is committed to providing qualified individuals access to all academic and employment programs, benefits and activities on the basis of demonstrated ability, performance and merit without regard to personal factors or demographic characteristics that are irrelevant to the program involved.