Postdoctoral Fellow (PREP0004220)

Johns Hopkins University; Baltimore (MD); On-site; USD 55,000 - 75,000; Full time

Job summary

Johns Hopkins University is seeking a PREP Research Associate for its CHIPS Funded Project focusing on nanometer-scale planar reference materials. This role involves collaboration with NIST researchers and performing technical work to support scientific research.

The ideal candidate will conduct research on advanced metrology methods specifically for thin films on silicon-based wafers and possess proficiency in Python for data analysis. Strongly preferred are U.S. citizens with a background in X-ray metrology.

Qualifications

• U.S. Citizenship is preferred.
• Background in advanced X‑ray metrology and thin film characterization.
• Experience with wafer fabrication and handling is desirable.

Responsibilities

• Plan and conduct research on advanced X-ray metrologies.
• Use lab-based and synchrotron X-ray characterization methods.
• Perform wafer dicing, cleaning, and packaging of samples.
• Publish results in archival scientific journals.

Skills

Advanced X‑ray metrology

Thin film characterization

Data analysis

Python for data fitting

Job description

Overview

PREP Research Associate – CHIPS Funded Project. Nanometer‑Scale Planar Reference Materials (U.S. Citizens Preferred).

This position is part of the National Institute of Standards and Technology (NIST) Professional Research Experience Program (PREP). It involves collaboration with academic researchers on projects of mutual interest and requires members of the project team to be recipients of a PREP award. Individuals in this position will perform technical work supporting the scientific research of the project.

The Material Measurement Laboratory at NIST is seeking qualified individuals (U.S. Citizens preferred) to join a research team within the NIST/CHIPS Nanometer‑Scale Planar Reference Materials project. The work centers on advanced metrology methods to characterize local physical and chemical properties and map variation in thin, nanometer‑scale films deposited on Si (and SiC) wafers.

The candidate will measure and analyze these wafers using X‑ray and optical methods to determine, through hybrid metrology, structural maps for wafers with thin films of interest to the semiconductor community.

Key Responsibilities

• Plan and conduct research on advanced X‑ray metrologies to determine structural (physical and chemical) properties of blanket (non‑patterned) thin films on Si and Si C wafers
• Use lab‑based and synchrotron X‑ray characterization methods to determine the structural properties of thin film samples
• Use open‑source Python fitting methods to constrain structural models, determine uncertainties, and combine these properties into a hybrid metrology digital wafer
• Perform wafer dicing, cleaning, and packaging of samples for distribution as Research Grade Test Materials
• Publish results in archival scientific journals and present results at topical meetings

Qualifications

U.S. Citizenship is preferred. Candidates should have a background in advanced X‑ray metrology, thin film characterization, and data analysis. Proficiency in Python for data fitting and modeling is required. Experience with wafer fabrication and handling is desirable.

Equal Opportunity Statement

The organization is committed to equal opportunity for its faculty, staff, and students. It does not discriminate on the basis of sex, gender, marital status, pregnancy, race, color, ethnicity, national origin, age, disability, religion, sexual orientation, gender identity or expression, veteran status, or other legally protected characteristics. The organization is committed to providing qualified individuals access to all academic and employment programs, benefits, and activities on the basis of demonstrated ability, performance, and merit without regard to personal factors or demographic characteristics that are irrelevant to the program involved.

Background Checks

After receiving a conditional offer, the successful candidate(s) for this position will be subject to pre‑employment background checks, including education verification. When deciding whether a candidate's conviction history is job‑disqualifying, the organization considers the nature, gravity, time elapsed since conviction, and relevance to the job.

EEO Statement

EEO is the Law. https://www.eeoc.gov/employees-job-applicants