Postdoctoral Fellow (PREP0004220)

The Chronicle Of Higher Education, Inc.; Gaithersburg (MD); On-site; USD 85,447 - 88,500; Full time

Benefits offered by this job

Comprehensive benefits package including health, life, retirement, and career development support.

Job summary

The Chronicle Of Higher Education, Inc. is seeking a PREP Research Associate for a funded project at Johns Hopkins University, focusing on advanced metrology of nanometer-scale films. This role involves planning and conducting research using X-ray techniques and Python programming. Candidates should possess an advanced degree or significant experience in relevant fields, with a strong emphasis on analytical and problem-solving skills. The position offers a salary range of $85,447 – $88,500 per annum, along with a comprehensive benefits package.

Qualifications

• Advanced degree or significant experience in materials science, physics, engineering, or related fields.
• Proficiency with X-ray and optical characterization techniques.
• Experience with data analysis, modeling, and Python programming.

Responsibilities

• Plan and conduct research on advanced X-ray metrologies.
• Analyze thin-film samples using synchrotron techniques.
• Apply Python methods to integrate properties into hybrid metrology models.
• Perform wafer dicing and cleaning for research-grade materials.
• Publish results and present findings at conferences.

Skills

X-ray and optical characterization techniques

Data analysis

Python programming

Analytical skills

Problem-solving

Education

Advanced degree in materials science, physics, engineering, or related fields

Job description

Job Summary

Position: PREP Research Associate – CHIPS Funded Project (Nanometer-Scale Planar Reference Materials)

Location: Johns Hopkins University, Whiting School of Engineering, Office of Research and Translation

Salary: $85,447 – $88,500 per annum

The PREP (Professional Research Experience Program) Research Associate will collaborate with the National Institute of Standards and Technology on advanced metrology projects focused on characterizing thin, nanometer-scale films deposited on silicon and silicon‑carbide wafers. U.S. citizenship is preferred.

Key Responsibilities

• Plan and conduct research on advanced X‑ray metrologies to determine structural properties of blanket thin films on Si and SiC wafers
• Use laboratory‑based and synchrotron X‑ray characterization methods to analyze thin‑film samples
• Apply open‑source Python fitting methods to constrain structural models, estimate uncertainties, and integrate properties into hybrid metrology digital wafer representations
• Perform wafer dicing, cleaning, and packaging of samples for distribution as research‑grade test materials
• Publish results in peer‑reviewed scientific journals and present findings at topical conferences

Qualifications

• Advanced degree or significant experience in materials science, physics, engineering, or related fields
• Proficiency with X‑ray and optical characterization techniques
• Experience with data analysis, modeling, and Python programming
• Strong analytical and problem‑solving skills
• U.S. citizenship preferred

Compensation & Benefits

Salary Range: $85,447 – $88,500, based on experience and qualifications.

Johns Hopkins University provides a comprehensive benefits package that includes health, life, retirement, and career development support.

Equal Employment Opportunity Statement

Johns Hopkins University is an equal opportunity employer committed to diversity and inclusion. It does not discriminate on the basis of sex, gender, marital status, pregnancy, race, color, ethnicity, national origin, age, disability, religion, sexual orientation, gender identity or expression, veteran status, or any other legally protected characteristic.