Postdoc, Nano-Scale Metrology (X-ray & Python)

Johns Hopkins University; Baltimore (MD); On-site; USD 55,000 - 75,000; Full time

Job summary

Johns Hopkins University is seeking a PREP Research Associate for its CHIPS Funded Project focusing on nanometer-scale planar reference materials. This role involves collaboration with NIST researchers and performing technical work to support scientific research.

The ideal candidate will conduct research on advanced metrology methods specifically for thin films on silicon-based wafers and possess proficiency in Python for data analysis. Strongly preferred are U.S. citizens with a background in X-ray metrology.

Qualifications

• U.S. Citizenship is preferred.
• Background in advanced X‑ray metrology and thin film characterization.
• Experience with wafer fabrication and handling is desirable.

Responsibilities

• Plan and conduct research on advanced X-ray metrologies.
• Use lab-based and synchrotron X-ray characterization methods.
• Perform wafer dicing, cleaning, and packaging of samples.
• Publish results in archival scientific journals.

Skills

Advanced X‑ray metrology

Thin film characterization

Data analysis

Python for data fitting

Job description

Johns Hopkins University is seeking a PREP Research Associate for its CHIPS Funded Project focusing on nanometer-scale planar reference materials. This role involves collaboration with NIST researchers and performing technical work to support scientific research.

The ideal candidate will conduct research on advanced metrology methods specifically for thin films on silicon-based wafers and possess proficiency in Python for data analysis. Strongly preferred are U.S. citizens with a background in X-ray metrology.