ASIC Engineer, Design for Test

Meta; Austin (TX); On-site; USD 146,000 - 209,000; Full time

Job summary

Meta is seeking an ASIC Engineer specializing in Design for Test (DFT) to architect and implement testability solutions for large-scale infrastructure ASICs. You will define DFT strategies from RTL through silicon bring-up, ensuring manufacturability, diagnosability, and high fault coverage across multi-billion gate designs.

You will collaborate with design, physical implementation, and validation teams to deliver silicon that meets aggressive quality and time-to-market targets.

Qualifications

• Bachelor's degree in Computer Science, Computer Engineering, relevant technical field, or equivalent practical experience.
• 6+ years of experience in DFT engineering for complex ASIC or SoC designs, including scan insertion, ATPG pattern generation, and MBIST implementation.
• Experience with industry-standard DFT EDA tools for scan compression, ATPG, and memory test (e.g., Tessent, Synopsys DTF Compiler, TetraMAX)
• Experience achieving high fault coverage targets across multiple fault models (stuck-at, transition delay, cell-aware) on multi-million gate designs
• Experience supporting silicon bring-up and manufacturing test, including ATE correlation and scan-based diagnosis
• Experience scripting in Tcl, Python, or Perl to develop and maintain DFT automation flows

Responsibilities

• Define and implement comprehensive DFT architectures including scan insertion, ATPG, MBIST, LBIST, and boundary scan for large-scale infrastructure ASICs
• Develop and drive DFT methodology and flows from RTL through tape-out, including scan compression, test point insertion, and clock domain handling
• Generate, simulate, and validate ATPG test patterns to achieve target fault coverage across stuck-at, transition, path delay, and cell-aware fault models
• Collaborate with physical design teams to ensure DFT structures meet timing, area, and power constraints during implementation
• Partner with silicon validation and manufacturing test teams to define ATE test programs and support post-silicon debug and diagnosis
• Perform DFT sign-off including fault coverage analysis, test coverage reporting, and DRC/LVS compliance for testability structures
• Develop and maintain DFT scripts and automation to improve flow efficiency, reduce manual effort, and enable reuse across chip generations
• Support silicon bring-up activities by analyzing failure data, performing scan diagnosis, and identifying root causes of manufacturing defects
• Contribute to DFT roadmap planning by evaluating emerging test methodologies and recommending improvements to Meta's silicon test strategy
• Provide technical guidance to peers on DFT best practices, design partitioning for testability, and cross-functional trade-off decisions

Skills

DFT engineering

ATPG generation

MBIST implementation

Scan insertion

Memory test

Tcl/Python scripting

Education

Bachelor's degree

Equivalent practical experience

Tools

Tessent

Synopsys DFT Compiler

TetraMAX

Job description

Summary:

Meta is building custom silicon to power the next generation of infrastructure and computing platforms. As an ASIC Engineer specializing in Design for Test (DFT) on the Infrastructure Silicon team, you will architect and implement testability solutions for complex, high-performance ASICs deployed at scale across Meta's data center infrastructure. In this role, you will define DFT strategies from RTL through silicon bring-up, ensuring manufacturability, diagnosability, and high fault coverage across large, multi-billion gate designs. You will collaborate closely with design, physical implementation, and validation teams to deliver silicon that meets aggressive quality and time-to-market targets.

Required Skills:

ASIC Engineer, Design for Test Responsibilities:

1. Define and implement comprehensive DFT architectures including scan insertion, ATPG, MBIST, LBIST, and boundary scan for large-scale infrastructure ASICs

2. Develop and drive DFT methodology and flows from RTL through tape-out, including scan compression, test point insertion, and clock domain handling

3. Generate, simulate, and validate ATPG test patterns to achieve target fault coverage across stuck-at, transition, path delay, and cell-aware fault models

4. Collaborate with physical design teams to ensure DFT structures meet timing, area, and power constraints during implementation

5. Partner with silicon validation and manufacturing test teams to define ATE test programs and support post-silicon debug and diagnosis

6. Perform DFT sign-off including fault coverage analysis, test coverage reporting, and DRC/LVS compliance for testability structures

7. Develop and maintain DFT scripts and automation to improve flow efficiency, reduce manual effort, and enable reuse across chip generations

8. Support silicon bring-up activities by analyzing failure data, performing scan diagnosis, and identifying root causes of manufacturing defects

9. Contribute to DFT roadmap planning by evaluating emerging test methodologies and recommending improvements to Meta's silicon test strategy

10. Provide technical guidance to peers on DFT best practices, design partitioning for testability, and cross-functional trade-off decisions

Minimum Qualifications:

1. Bachelor's degree in Computer Science, Computer Engineering, relevant technical field, or equivalent practical experience

2. 6+ years of experience in DFT engineering for complex ASIC or SoC designs, including scan insertion, ATPG pattern generation, and MBIST implementation

3. Experience with industry-standard DFT EDA tools for scan compression, ATPG, and memory test (e.g., Tessent, Synopsys DFT Compiler, TetraMAX)

4. Experience achieving high fault coverage targets across multiple fault models (stuck-at, transition delay, cell-aware) on multi-million gate designs

5. Experience supporting silicon bring-up and manufacturing test, including ATE correlation and scan-based diagnosis

6. Experience scripting in Tcl, Python, or Perl to develop and maintain DFT automation flows

Preferred Qualifications:

1. Familiarity with IEEE 1500, IEEE 1687 (IJTAG), or IEEE 1149.1 boundary scan standards and their application in infrastructure ASICs

2. Background in post-silicon failure analysis and yield improvement using scan diagnosis and statistical defect modeling

3. Experience with at-speed test methodologies including launch-on-capture and launch-on-shift for timing-critical paths

4. Experience with DFT architecture for high-speed SerDes interfaces, mixed-signal IP, or hierarchical test integration in large multi-die or chiplet designs

Public Compensation:

$146,000/year to $209,000/year + bonus + equity + benefits

Industry:

Internet

Equal Opportunity:

Meta is proud to be an Equal Employment Opportunity and Aff… We do not discriminate based upon race, religion, color, national origin, sex (including pregnancy, childbirth, or related medical conditions), sexual orientation, gender, gender identity, gender expression, transgender status, or sexual stereotypes, age, status as a protected veteran, status as an individual with a disability, or other applicable legally protected characteristics. We also consider qualified applicants with criminal histories, consistent with applicable federal, state and local law. Meta participates in the E-Verify program in certain locations, as required by law. Please note that Meta may leverage artificial intelligence and machine learning technologies in connection with applications for employment.

Meta is committed to providing reasonable accommodations for candidates with disabilities in our recruiting process. If you need any assistance or accommodations due to a disability, please let us know at [e-mail].