Staff Engineer, Metrology Innovation (FIB/AFM/SEM)

MICRON SEMICONDUCTOR ASIA OPERATIONS PTE. LTD.; Singapore; On-site; SGD 120,000 - 180,000; Full time

Job summary

MICRON SEMICONDUCTOR ASIA OPERATIONS PTE. LTD. is seeking a senior metrology development professional to lead the development, qualification, and deployment of advanced metrology applications for 3D NAND process development.

Focus will be on FIB and supported by AFM, SEM or WLI. You will drive evaluation of next-generation metrology systems, assess capability, accuracy, and throughput, and collaborate with equipment suppliers to roadmap technology for future NAND processes.

Qualifications

• Master's or PhD degree in Materials Science, Mechanical Engineering, Electrical Engineering or Applied Physics.

Responsibilities

• Own the development, qualification, and deployment of advanced metrology applications for 3D NAND process development, with primary emphasis on FIB and one or more of AFM, SEM, or WLI.
• Develop and implement innovative metrology solutions utilizing FIB, AFM, SEM, and related techniques to close inline detection gaps and accelerate process learning.
• Lead evaluation, qualification, and deployment of FOAK technologies across FIB, AFM, SEM, WLI, and other metrology platforms.
• Establish technology roadmaps aligned with NAND technology requirements and collaborate with suppliers and industry partners.
• Identify modeling opportunities using metrology data analytics, AI, and ML to understand electrical failure signatures and impact on yield and reliability.
• Collaborate with Process Integration, Yield Enhancement, Process Development Engineering and Manufacturing teams to enable rapid deployment of characterization solutions.

Education

Master's or PhD in Materials Science, Mechanical Engineering, Electrical Engineering or Applied Physics

Tools

Focused Ion Beam (FIB)

Atomic Force Microscopy (AFM)

Scanning Electron Microscopy (SEM)

White Light Interferometry (WLI)

AI/ML in metrology

Job description

MICRON SEMICONDUCTOR ASIA OPERATIONS PTE. LTD. is seeking a senior metrology development professional to lead the development, qualification, and deployment of advanced metrology applications for 3D NAND process development.

Focus will be on FIB and supported by AFM, SEM or WLI. You will drive evaluation of next-generation metrology systems, assess capability, accuracy, and throughput, and collaborate with equipment suppliers to roadmap technology for future NAND processes.