Senior Metrology Engineer - FIB/AFM & SEM Innovations

micron semiconductor asia operations pte. ltd.

Singapore

On-site

SGD 120,000 - 170,000

Full time

13 days ago
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Job summary

micron semiconductor asia operations pte. ltd. seeks a senior metrology scientist to drive the development and deployment of advanced metrology applications for 3D NAND processes, with emphasis on FIB, AFM, and SEM/WLI.

The role requires leadership in evaluating new metrology systems and integrating AI/ML analytics to close inline gaps and accelerate learning. You will collaborate across Process Integration, Yield, and Manufacturing to deliver scalable characterization solutions and shape future

Qualifications

  • Master's or PhD in Materials Science, Mechanical Engineering, Electrical Engineering or Applied Physics.
  • Minimum 7 years in semiconductor metrology development with ownership of new metrology applications and inline monitoring solutions incl. FIB and AFM/SEM/WLI.
  • Minimum 5 years hands-on experience in Focused Ion Beam (FIB) and at least one other advanced metrology technique (AFM, WLI or SEM).
  • Experience developing metrology applications for process characterization, inline monitoring, root-cause analysis and technology transfer.

Responsibilities

  • Own development, qualification, and deployment of advanced metrology applications for 3D NAND process development focusing on FIB and AFM/SEM/WLI.
  • Lead evaluation and deployment of next-gen metrology systems including FOAK technologies and assess measurement capability, accuracy, repeatability, throughput, automation, and readiness.
  • Establish technology roadmaps aligned with future NAND requirements and partner with suppliers and collaborators.
  • Identify modeling opportunities using metrology data analytics, AI/ML, to understand failure signatures and impact on yield and reliability.
  • Collaborate with Process Integration, Yield Enhancement, Process Development, and Manufacturing to enable rapid deployment of characterization solutions.

Skills

FIB metrology
AFM
SEM
WLI
AI/ML in metrology
Data analytics

Education

Master's degree in Materials Science
PhD in Materials Science / Mechanical / Electrical / Applied Physics

Tools

Metrology equipment
FOAK systems

Job description

micron semiconductor asia operations pte. ltd. seeks a senior metrology scientist to drive the development and deployment of advanced metrology applications for 3D NAND processes, with emphasis on FIB, AFM, and SEM/WLI.

The role requires leadership in evaluating new metrology systems and integrating AI/ML analytics to close inline gaps and accelerate learning. You will collaborate across Process Integration, Yield, and Manufacturing to deliver scalable characterization solutions and shape future

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