Senior Engineer – Metrology Process Development | Micron Technology, Singapore

NanoHelp; Singapore; On-site; SGD 80,000 - 110,000; Full time

Job summary

A global semiconductor manufacturer in Singapore is seeking a Senior Engineer to lead innovation in metrology involving Focused Ion Beam technology. You will develop advanced defect detection methods, enhance reliability, and collaborate with engineering teams. The ideal candidate has a Master’s degree and substantial experience in the semiconductor industry. This role promotes an inclusive work environment and offers opportunities to impact manufacturing outcomes.

Qualifications

• 5+ years of direct hands-on experience with FIB tools and nanoscale metrology in the semiconductor industry.
• Analytical acumen to connect metrology signals to electrical performance metrics.
• Experience improving yield and product reliability through metrology innovation.

Responsibilities

• Lead the development of advanced inline defect detection methods.
• Enhance process reliability and develop FOAK metrology solutions.
• Collaborate with engineering teams on product performance.

Skills

Direct experience with FIB tools

Nanoscale metrology

Strong analytical skills

Team leadership

Education

Master’s degree in Materials Science, Engineering, or Applied Physics

Job description

Senior Engineer – Metrology Process Development | Micron Technology, Singapore

Drive nanoscale precision with advanced FIB metrology in semiconductor innovation

Micron Singapore is seeking a Senior Engineer in Metrology Process Development to lead innovation in Focused Ion Beam (FIB) technology, collaborating across disciplines to enhance product performance, detect nanoscale defects, and drive reliability.

Job Details:

• Title: Senior Engineer – Metrology Process Development
• Organization: Micron Technology, Inc.
• Work Location: Singapore
• Research Field: Nanotechnology, Materials Science, Applied Physics, Electronics, Engineering
• Funding Info: Industry-funded (Micron Technology)
• Application Deadline: Rolling
• Posted Date: July 2025
• Country: Singapore

Responsibilities:

• Lead the development and optimization of advanced inline defect detection and failure analysis methods.
• Enhance process reliability and enable first-of-a-kind (FOAK) metrology solutions that elevate both product yield and electrical performance.
• Lead application development and optimization of FIB systems to address inline detection gaps.
• Collaborate across engineering teams to close the loop between detection, root cause, and product performance.
• Integrate modeling techniques using metrology and electrical data to enhance failure understanding.
• Spearhead FOAK equipment adoption to scale advanced metrology capabilities.
• Mentor junior engineers and support task force activities across functions.
• Build supplier relationships and manage technology roadmaps to ensure tool performance and reliability.

Ideal Candidate Profile:

• Master’s degree in Materials Science, Engineering, or Applied Physics
• 5+ years of direct hands-on experience with FIB tools and nanoscale metrology in the semiconductor industry
• Strong analytical acumen to connect metrology signals to electrical performance metrics
• Experience improving yield and product reliability through metrology innovation
• Confident communicator and mentor with team leadership potential

This role offers the chance to impact real-world manufacturing outcomes by enabling atomic-level insights into defect formation and propagation. You’ll be part of an inclusive and collaborative environment, working at the frontier of memory technology alongside global experts in nanotechnology, process integration, and reliability.

Micron does not charge recruitment fees or request payments from applicants. Ensure all application materials are truthful, even when enhanced by AI tools. Fraudulent representations will result in disqualification.