Lead Metrology Engineer: FIB/SEM, AFM & AI

MICRON SEMICONDUCTOR ASIA OPERATIONS PTE LTD

Singapore

On-site

SGD 180,000 - 240,000

Full time

5 days ago

Be an early applicant

Application generator

Turn this role into an interview — a resume and cover letter built around what this employer wants.

Get past ATS filters

Job summary

Micron Technology, Inc. is seeking a senior metrology expert to lead development and deployment of advanced metrology for 3D NAND process development, focusing on Focused Ion Beam (FIB) and complementary techniques.

You will collaborate across process, yield, and manufacturing teams to translate measurement insights into improved yield and reliability. This role emphasizes building roadmaps with suppliers, evaluating new FOAK systems, and applying AI/ML to metrology data to diagnose electrical

Qualifications

7+ years semiconductor metrology development experience with ownership of new metrology applications.
Hands-on experience in FIB and at least one of AFM, SEM or WLI.
Track record in qualification of new metrology technologies and supplier engagement.
Experience in process characterization, inline monitoring, and technology transfer.

Responsibilities

Own development, qualification, and deployment of advanced metrology for 3D NAND process development (FIB, AFM, SEM, and related techniques).
Develop innovative metrology solutions to close inline detection gaps and accelerate process learning.
Lead evaluation of next-generation metrology systems and FOAK technologies across FIB, AFM, SEM, and related platforms.
Collaborate with SI teams to align roadmaps with NAND technology requirements and drive AI/ML-based data analytics.