Senior/Staff Engineer, NTI Metrology

MICRON SEMICONDUCTOR ASIA OPERATIONS PTE LTD; Singapore; On-site; SGD 180,000 - 240,000; Full time

Job summary

Micron Technology, Inc. is seeking a senior metrology expert to lead development and deployment of advanced metrology for 3D NAND process development, focusing on Focused Ion Beam (FIB) and complementary techniques.

You will collaborate across process, yield, and manufacturing teams to translate measurement insights into improved yield and reliability. This role emphasizes building roadmaps with suppliers, evaluating new FOAK systems, and applying AI/ML to metrology data to diagnose electrical

Qualifications

• 7+ years semiconductor metrology development experience with ownership of new metrology applications.
• Hands-on experience in FIB and at least one of AFM, SEM or WLI.
• Track record in qualification of new metrology technologies and supplier engagement.
• Experience in process characterization, inline monitoring, and technology transfer.

Responsibilities

• Own development, qualification, and deployment of advanced metrology for 3D NAND process development (FIB, AFM, SEM, and related techniques).
• Develop innovative metrology solutions to close inline detection gaps and accelerate process learning.
• Lead evaluation of next-generation metrology systems and FOAK technologies across FIB, AFM, SEM, and related platforms.
• Collaborate with SI teams to align roadmaps with NAND technology requirements and drive AI/ML-based data analytics.

Skills

FIB metrology

AFM

SEM

WLI

AI/ML analysis

Education

Master's/PhD in Materials/Engineering/Physics

Job description

Our vision is to transform how the world uses information to enrich life for all.

Join an inclusive team passionate about one thing: using their expertise in the relentless pursuit of innovation for customers and partners. The solutions we build help make everything from virtual reality experiences to breakthroughs in neural networks possible. We do it all while committing to integrity, sustainability, and giving back to our communities. Because doing so can fuel the very innovation we are pursuing.

Responsibilities:

• Own the development, qualification, and deployment of advanced metrology applications for 3D NAND process development, with primary emphasis on Focused Ion Beam (FIB) and one or more of the following:
  • Atomic Force Microscopy (AFM)
  • Optical interferometry or White Light Interferometry (WLI)
  • Scanning Electron Microscopy (SEM)
  • Semiconductor electrical or non-contact characterization methods
• Develop and implement innovative metrology solutions utilizing FIB, AFM, SEM, and related characterization techniques to close inline detection gaps and accelerate process learning.
• Lead the evaluation, qualification, and deployment of next-generation metrology systems and First-of-a-Kind (FOAK) technologies, including assessment of measurement capability, accuracy, repeatability, throughput, automation, and manufacturing readiness across FIB, AFM, SEM, and other advanced metrology platforms.
• Establish and drive technology roadmaps, ensuring alignment with future NAND technology requirements while fostering strong technical partnerships with equipment suppliers and industry collaborators.
• Identify and develop modeling opportunities using metrology, defect detection, artificial intelligence (AI), and machine learning (ML) techniques in conjunction with metrology data analytics to understand electrical failure signatures observed at probe and their impact on product reliability, yield, and performance.
• Collaborate closely with Process Integration, Yield Enhancement, Process Development Engineering and Manufacturing teams to develop innovative characterization solutions and enable rapid technology deployment

Qualifications:

• Master's or PhD degree in Materials Science, Mechanical Engineering, Electrical Engineering or Applied Physics.
• Minimum 7 years of semiconductor metrology development experience with demonstrated ownership and experience developing new metrology applications, recipes, methodologies or inline monitoring solutionsacross advanced characterization platforms, including FIB and one or more of the following: AFM, SEM, or WLI (not users of Metrology data).
• Minimum 5 years of hands‑on experience in Focused Ion Beam (FIB) and at least one additional advanced metrology technique from the following
  • Atomic Force Microscopy (AFM)
  • While Light Interferometry (WLI)
  • Scanning Electron Microscopy (SEM)
• Demonstrated track record developing advanced semiconductor metrology applications for process characterization, inline monitoring, root‑cause analysis, yield improvement, reliability investigations, and technology transfer, including qualification of new metrology technologies and direct engagement with suppliers to establish application capability and technology roadmaps.
• Candidates whose experience is primarily limited to process engineering, yield engineering, failure analysis, or data analysis roles without direct metrology application development responsibility will not be considered.

About Micron Technology, Inc.

We are an industry leader in innovative memory and storage solutions transforming how the world uses information to enrich lifefor all. With a relentless focus on our customers, technology leadership, and manufacturing and operational excellence, Micron delivers a rich portfolio of high‑performance DRAM, NAND, and NOR memory and storage products through our Micron® and Crucial® brands. Every day, the innovations that our people create fuel the data economy, enabling advances in artificial intelligence and 5G applications that unleash opportunities — from the data center to the intelligent edge and across the client and mobile user experience.

To learn more, please visit micron.com/careers

All qualified applicants will receive consideration for employment without regard to race, color, religion, sex, sexual orientation, gender identity, national origin, veteran or disability status.

To request assistance with the application process and/or for reasonable accommodations,please contact @micron.com

Micron Prohibits the use of child labor and complies with all applicable laws, rules, regulations, and other international and industry labor standards.

Micron does not charge candidates any recruitment fees or unlawfully collect any other payment from candidates as consideration for their employment with Micron.

AI alert: Candidates are encouraged to use AI tools to enhance their resume and/or application materials. However, all information provided must be accurate and reflect the candidate's true skills and experiences. Misuse of AI to fabricate or misrepresent qualifications will result in immediate disqualification.

Fraud alert: Micron advises job seekers to be cautious of unsolicited job offers and to verify the authenticity of any communication claiming to be from Micron by checking the official Micron careers website in the About Micron Technology, Inc.