Advanced Packaging Metrology Engineer: Real-Time Defect Analysis

Micron Technology

Singapore

On-site

SGD 90,000 - 130,000

Full time

3 days ago
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Job summary

Micron Technology Singapore is seeking an Advanced Packaging Metrology‑RDA Engineer to develop metrology recipes for high‑performance memory packaging. You will optimize inspection methods, perform in‑line characterization, and analyze data with tools like Power BI to drive continuous improvement.

A strong background in semiconductor processing and statistics is required, with AI‑enabled optimization encouraged.

Qualifications

  • PhD with ≥2 years or Master’s with ≥5 years or Bachelor’s with ≥7 years in relevant fields.
  • Experience in semiconductor process or equipment engineering, wafer bonding, plating, warpage control and packaging.
  • Strong data analytics and experience with SPC, DOE, defect analysis and dashboarding.

Responsibilities

  • Develop and optimize metrology recipes for semiconductor processes.
  • Establish inspection methodologies and best-known methods for metrology.
  • Utilize Power BI to summarize and report metrology status and project progress.
  • Own metrology tools and ensure they meet performance indicators and quality standards.
  • Collaborate with multiple teams to integrate manufacturing processes for performance and quality.
  • Apply AI-enabled tools to improve efficiency and outcomes.

Skills

Python
R
SQL
Data analytics
Statistical thinking

Education

PhD in Electrical Engineering, Materials Science, Chemical Engineering, Physics or related field
Master’s degree in related field
Bachelor’s degree in related field

Tools

Visual Basic for automation
E3
FDC
RMS

Job description

Micron Technology Singapore is seeking an Advanced Packaging Metrology‑RDA Engineer to develop metrology recipes for high‑performance memory packaging. You will optimize inspection methods, perform in‑line characterization, and analyze data with tools like Power BI to drive continuous improvement.

A strong background in semiconductor processing and statistics is required, with AI‑enabled optimization encouraged.

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