Nanoscale SMIM for Advanced Semiconductor Characterization

Imec; Vlaams-Brabant; On-site; EUR 11,000 - 15,000; Full time

Benefits offered by this job

Imec allowance provided

Job summary

Imec in Belgium invites a Master internship focused on exploring Scanning Microwave Microscopy for advanced semiconductor characterization. You will evaluate and fine-tune electrical measurements on the nanometer scale.

The project aims to establish SMIM as a characterization capability for semiconductor materials and devices, with emphasis on understanding microwave response and linking it to material properties.

Qualifications

• Master-level student in a relevant field.
• Strong background in semiconductor physics and electrical measurements.
• Experience with scanning probe microscopy is a plus.

Responsibilities

• Evaluate and fine-tune nanoscale electrical measurements.
• Explore SMIM as a characterization capability for semiconductor materials and devices.
• Calibrate, model tip-sample interaction and analyze microwave signals.

Skills

English proficiency

Semiconductor physics

Education

Master's degree in Electrotechnics/Electrical Engineering

Physics

Nanoscience & Nanotechnology

Materials Engineering

Tools

SMIM

AFM/SCM techniques

Job description

Imec in Belgium invites a Master internship focused on exploring Scanning Microwave Microscopy for advanced semiconductor characterization. You will evaluate and fine-tune electrical measurements on the nanometer scale.

The project aims to establish SMIM as a characterization capability for semiconductor materials and devices, with emphasis on understanding microwave response and linking it to material properties.