Quantitative AFM Nanomechanics for Advanced Patterning

Imec; Belgique; Remote; EUR 12,000 - 18,000; Full time

Benefits offered by this job

Imec allowance provided

Job summary

Imec invites Master or PhD interns to work on quantitative AFM nanomechanical metrology for advanced semiconductor patterning. The project focuses on measuring mechanical properties of thin films and pattern features in nanometre-scale regimes.

You will evaluate AFM approaches, study influences of film thickness and substrate, and develop an uncertainty-aware workflow for reliable data interpretation. Imec provides a supportive research environment.

Qualifications

• Hands-on AFM-related techniques
• Ability to design robust experiments
• Experience with data analysis workflows

Responsibilities

• Define and implement AFM nanomechanical measurements for patterned materials.
• Investigate parameter effects on measured mechanical response.
• Identify artefacts due to substrate, edges, and geometry.
• Develop uncertainty-aware measurement and analysis workflow.
• Coordinate with supervising scientists and document results.

Skills

AFM techniques

experimental design

quantitative data analysis

nanomechanics

Education

Master/PhD in Electrotechnics/Electrical Engineering, Physics, Nanoscience & Nanotechnology, Materials Engineering

Job description

Imec invites Master or PhD interns to work on quantitative AFM nanomechanical metrology for advanced semiconductor patterning. The project focuses on measuring mechanical properties of thin films and pattern features in nanometre-scale regimes.

You will evaluate AFM approaches, study influences of film thickness and substrate, and develop an uncertainty-aware workflow for reliable data interpretation. Imec provides a supportive research environment.