Wafer Optical Metrology Engineer: Precision in Action

WD; Fremont (CA); On-site; USD 102,500 - 136,600; Full time

Benefits offered by this job

Comprehensive benefits package

Tuition reimbursement

Paid vacation time

Employee stock purchase plan

Job summary

WD is seeking a highly motivated Wafer Optical Metrology Engineer to support advanced thin-film magnetic read/write head manufacturing in Fremont, California. The engineer will develop and optimize optical metrology methodologies for wafer manufacturing, focusing on enhancing measurement accuracy and process capability.

The ideal candidate will have a degree in Physics, Optics, Engineering, or Material Science, and 0–3 years of experience. Key duties involve recipe development, data analysis, and driving continuous improvements in measurement processes.

Qualifications

• 0–3 years of relevant work experience.
• Knowledge of statistical process control and data analysis techniques.
• Willingness to work hands-on in a clean room environment.

Responsibilities

• Develop optical metrology recipes for wafer manufacturing processes.
• Analyze data trends and implement corrective actions.
• Perform statistical analysis and process capability studies.

Skills

Overlay metrology

Semiconductor process control

Lithography alignment

Statistical analysis

Root cause analysis

Automation and scripting

Technical communication

Education

B.S. or M.S. in Physics, Optics, Engineering or Material Science

Tools

Python

JMP

Job description

WD is seeking a highly motivated Wafer Optical Metrology Engineer to support advanced thin-film magnetic read/write head manufacturing in Fremont, California. The engineer will develop and optimize optical metrology methodologies for wafer manufacturing, focusing on enhancing measurement accuracy and process capability.

The ideal candidate will have a degree in Physics, Optics, Engineering, or Material Science, and 0–3 years of experience. Key duties involve recipe development, data analysis, and driving continuous improvements in measurement processes.