Metrology Engineer: FIB-Driven Wafer Quality & Yield

Headway Technologies; Milpitas (CA); On-site; USD 121,000 - 160,000; Full time

Job summary

Headway Technologies is seeking a Metrology Engineer to develop and implement methodologies for improving wafer quality on prototype wafers, with a focus on FIB tools. The role reports to the Sr. Director of Process Characterization/NPI and is based in Milpitas, CA.

You will create and optimize FIB recipes, analyze root causes using JMP or similar tools, and contribute to new technology programs. Strong background in yield improvement and failure analysis is essential.

Qualifications

• Bachelor’s degree in Electrical Engineering, Materials Science, or Physics; Master or PhD preferred.
• Three to five years in wafer manufacturing or semiconductor environment.
• Strong background in yield improvement and failure analysis.

Responsibilities

• Create and optimize recipes for prototype wafers using FIB tools.
• Interact with engineering groups on metrology requests and yield issues.
• Monitor prototype line activity and inline characterizations.
• Conduct failure analysis to improve wafer quality and yield.
• Develop process integration and characterization techniques for new tech programs.
• Perform wafer-level process characterization and recommend corrective actions.

Skills

FIB knowledge

Metrology

Data analysis

MS Office

JM P

Education

Bachelor's in EE / Materials / Physics

MS/PhD preferred

Tools

FIB

SEM

JMP

Microsoft Office

Job description

Headway Technologies is seeking a Metrology Engineer to develop and implement methodologies for improving wafer quality on prototype wafers, with a focus on FIB tools. The role reports to the Sr. Director of Process Characterization/NPI and is based in Milpitas, CA.

You will create and optimize FIB recipes, analyze root causes using JMP or similar tools, and contribute to new technology programs. Strong background in yield improvement and failure analysis is essential.