Postdoctoral Fellow: Nano-Scale X-Ray Metrology

Johns Hopkins University; Gaithersburg (MD); On-site; USD 60,000 - 80,000; Full time

Job summary

Johns Hopkins University in Gaithersburg seeks a Research Associate for the NIST CHIPS project, focusing on advanced X-ray metrology methods to characterize nanometer-scale thin films. Qualified candidates will conduct research, publish findings, and present at conferences.

Applicants must possess a Ph.D. in a relevant field and have experience with X-ray measurement techniques. Strong communication skills are also essential. Join a team that promotes scientific excellence and equal opportunity.

Qualifications

• Ph.D. is required in a relevant scientific discipline.
• Experience with X-ray reflectivity, fluorescence, or photoelectron spectroscopy is essential.
• Familiarity with clean-room protocols is preferred.

Responsibilities

• Plan and conduct research on thin films using advanced X-ray metrology.
• Characterize structural properties through various methods.
• Publish results in scientific journals.

Skills

X-ray measurement technique(s)

Programming using Python

Strong oral and written communication skills

Education

Ph.D. in physics, materials science, or a related field

Job description

Johns Hopkins University in Gaithersburg seeks a Research Associate for the NIST CHIPS project, focusing on advanced X-ray metrology methods to characterize nanometer-scale thin films. Qualified candidates will conduct research, publish findings, and present at conferences.

Applicants must possess a Ph.D. in a relevant field and have experience with X-ray measurement techniques. Strong communication skills are also essential. Join a team that promotes scientific excellence and equal opportunity.