Memory Test Engineer: AI-Driven Validation

Micron Technology

Boise (ID)

On-site

USD 90,000 - 120,000

Full time

11 days ago
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Benefits offered by this job

Medical plan
Dental plan
Vision plan
Paid time off
Paid holidays
Career development

Job summary

Micron Technology is seeking a Product Test Engineer to develop, debug and maintain test programs for memory products across the NPI to high-volume phases. You will write C++ and Python scripts, analyze test data and help shape next-gen test capabilities.

The role collaborates with Design, Fab, Manufacturing, and Quality teams to optimize test coverage, yield and quality in a cutting-edge memory environment at Micron facilities.

Qualifications

  • Bachelor’s degree or equivalent in Electrical Engineering, Computer Engineering, Computer Science or related discipline.
  • Basic circuit knowledge (R/L/C).
  • Digital systems and logic gate representation.
  • Understanding CMOS transistor operation.
  • Basic statistics and data analytics.

Responsibilities

  • Develop, debug and support test programs from new product introduction through high volume manufacturing.
  • Write test programs and support scripts in C++, Python.
  • Contribute input to define next generation design-for-test capabilities.
  • Analyze device and test flow data to inform test coverage decisions.
  • Balance test time objectives while maintaining yield and quality.
  • Collaborate with Design, Product Engineering, Fab, Manufacturing and Quality teams to deliver test solutions.

Skills

C++
Python

Education

Bachelor’s degree in Electrical Engineering, Computer Engineering, Computer Science or related discipline

Tools

Unix / Linux

Job description

Micron Technology is seeking a Product Test Engineer to develop, debug and maintain test programs for memory products across the NPI to high-volume phases. You will write C++ and Python scripts, analyze test data and help shape next-gen test capabilities.

The role collaborates with Design, Fab, Manufacturing, and Quality teams to optimize test coverage, yield and quality in a cutting-edge memory environment at Micron facilities.

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