Defect Metrology Lead - Semiconductor Yield & Analysis

Intel Corporation; Phoenix, Northern (AZ, KY); Hybrid; USD 89,000 - 171,000; Full time

Job summary

Intel Corporation in Arizona seeks a Defect Metrology Layer Owner to drive data-driven defect reduction in a high‑volume semiconductor environment. You will analyze complex yield data, collaborate with process engineers, and guide corrective actions to improve tool and process capability.

The role requires strong problem-solving, communication, and teamwork skills, with on-site presence in Phoenix. Preferred candidates may hold TS clearance and programming experience in JMP/JSL, Python, R, and

Qualifications

• Bachelor's degree in a relevant engineering or science field.
• 2+ years of semiconductor fabrication or related experience.
• Experience with SPC, DOE, and statistical data analysis.
• Programming experience: JMP/JSL, Python, R, and SQL.

Responsibilities

• Perform detailed data analysis to identify root causes of defect issues.
• Identify exclusionary or baseline sources of defects and recommend corrective actions.
• Lead continuous improvement projects to reduce defects and improve yield.
• Provide expertise on process flow segments and control areas for defect analysis.
• Lead multi-area problem solving teams to reduce defects.

Skills

Analytical skills

Problem solving

Attention to detail

Communication skills

Teamwork and leadership

Data analysis

Education

Bachelor's degree in engineering/related field

Tools

JMP/JSL

Python

R

SQL

Job description

Intel Corporation in Arizona seeks a Defect Metrology Layer Owner to drive data-driven defect reduction in a high‑volume semiconductor environment. You will analyze complex yield data, collaborate with process engineers, and guide corrective actions to improve tool and process capability.

The role requires strong problem-solving, communication, and teamwork skills, with on-site presence in Phoenix. Preferred candidates may hold TS clearance and programming experience in JMP/JSL, Python, R, and