Defect Metrology Lead for Semiconductor Yield & Data

Intel Corporation; Phoenix (AZ); On-site; USD 89,000 - 171,000; Full time

Job summary

Intel Corporation in Arizona is seeking an Ocotillo Technology Fabrication Defect Metrology Layer Owner to drive data-driven insights that minimize defects across a segment of the fabrication line.

You will perform detailed analyses, lead corrective actions, and collaborate with process engineers and field teams to enhance tool capability, process stability, and overall yield in a fast-paced, on-site environment.

Qualifications

• Bachelor’s degree in a relevant engineering discipline required; Master’s preferred.
• 2+ years in semiconductor fabrication or related field.
• Experience with SPC, DOE principles, and statistical data analysis.

Responsibilities

• Perform detailed data analysis to identify root causes of defect issues.
• Lead improvement projects to reduce defect performance and yield loss.
• Provide process-flow expertise and drive cross-functional problem solving.
• Collaborate with process engineers and on-site vendors for sustained improvements.

Skills

Statistical data analysis

SPC

DOE

Python

R

SQL

Data mining

Analytical thinking

Process engineering

Cross-functional collaboration

Education

Bachelor's degree in Electrical Engineering

Bachelor's degree in Microelectronics Engineering

Bachelor's degree in Material Science Engineering

Master’s degree in related field

Tools

JMP/JSL

Python

R

SQL

Job description

Intel Corporation in Arizona is seeking an Ocotillo Technology Fabrication Defect Metrology Layer Owner to drive data-driven insights that minimize defects across a segment of the fabrication line.

You will perform detailed analyses, lead corrective actions, and collaborate with process engineers and field teams to enhance tool capability, process stability, and overall yield in a fast-paced, on-site environment.