Defect Metrology Lead: Data-Driven Yield Improvement

Intel; Phoenix (AZ); On-site; USD 89,000 - 171,000; Full time

Job summary

Intel Foundry is advancing defect metrology with inline real-time monitoring to drive yield improvements across its Arizona manufacturing segment. The Defect Metrology Layer Owner will deliver high-quality analytical insights to minimize defects by collaborating with process engineers to enhance tool and process capability.

The role requires strong data analysis, problem solving, and cross-functional leadership to address complex yield issues in a fast-paced semiconductor environment.

Qualifications

• Bachelor’s degree in related engineering/science field.
• 2+ years semiconductor fabrication experience or Master’s degree.
• Experience with SPC, DOE and statistical data analysis.

Responsibilities

• Perform detailed data analysis to identify root causes of defects.
• Identify exclusionary/baseline defect sources and propose fixes.
• Lead continuous improvement projects for defect performance.
• Provide expertise on process flow segments and defect analysis.
• Lead cross-functional teams to reduce defects and troubleshoot yield.

Skills

Analytical skills

Interpersonal skills

Communication skills

Team collaboration

Education

Electrical Engineering

Physics or Chemistry

Tools

JMP/JSL

Python

R

SQL

Job description

Intel Foundry is advancing defect metrology with inline real-time monitoring to drive yield improvements across its Arizona manufacturing segment. The Defect Metrology Layer Owner will deliver high-quality analytical insights to minimize defects by collaborating with process engineers to enhance tool and process capability.

The role requires strong data analysis, problem solving, and cross-functional leadership to address complex yield issues in a fast-paced semiconductor environment.