Defect Metrology Lead: Yield Analytics & Process Insight

Intel Corporation; Chandler (AZ); On-site; USD 89,000 - 171,000; Full time

Benefits offered by this job

Competitive pay

Stock bonuses

Health benefits

Retirement plan

Vacation

Job summary

Intel Corporation in Phoenix, Arizona, seeks a Defect Metrology Layer Owner to deliver high-quality analytics that minimize defects and improve yield across a manufacturing segment. You will work with process engineers to enhance tool and process capability and lead cross-functional problem solving.

The role requires strong analytical and presentation skills, experience with statistical methods, and the ability to drive continuous improvement in a fast-paced manufacturing environment.

Qualifications

• Bachelor's degree in a relevant engineering/related field.
• 2+ years of semiconductor fabrication and processing experience.
• Master's degree in a related field is a plus.
• Experience with SPC, DOE, and statistical data analysis.

Responsibilities

• Performing detailed data analysis to identify root causes of defect issues.
• Identify defect sources and lead corrective actions.
• Lead continuous improvement projects for defect performance.
• Provide expertise on defect analysis across process segments.
• Lead problem-solving teams to reduce defects across manufacturing.

Skills

Data analysis

Problem solving

Communication

Teamwork

Interpersonal skills

Leadership

Education

Bachelor's degree

Master's degree

Tools

JMP/JSL

Python

R

SQL

Job description

Intel Corporation in Phoenix, Arizona, seeks a Defect Metrology Layer Owner to deliver high-quality analytics that minimize defects and improve yield across a manufacturing segment. You will work with process engineers to enhance tool and process capability and lead cross-functional problem solving.

The role requires strong analytical and presentation skills, experience with statistical methods, and the ability to drive continuous improvement in a fast-paced manufacturing environment.