Semiconductor Test & Product Development Engineer

Altera; Bayan Lepas; Presencial; MYR 70.000 - 150.000; Jornada completa

Descripción de la vacante

Altera in Penang, Malaysia seeks a Testability and Manufacturing Test Engineer to drive IC testability from feasibility through production ramp. You will develop test flows, validate DFx/DFM features, and collaborate across fab, process development, quality, and manufacturing teams to enable high-yield, scalable production.

Responsibilities include evaluating ATE platforms, performing device characterization, and defining datasheet specifications while reducing test time and costs.

Formación

• Bachelor's Degree in Electrical/Electronics/Computer Engineering or related field.
• Experience in semiconductor test development, product engineering, or manufacturing test environments.
• Familiarity with ATE platforms and test program development.
• Strong analytical and debugging skills.
• Excellent communication and teamwork skills.

Responsabilidades

• Drive testability and manufacturability of ICs from feasibility to production ramp.
• Develop test flows, circuits, and methodologies for new products.
• Interface with fab, process development, quality, and manufacturing teams.
• Perform ATE device characterization and yield analysis.
• Drive DFx/DFM features to enable efficient production testing.
• Lead manufacturing readiness for ES milestones and ramp.

Conocimientos

Analytical skills

Debugging skills

Communication

Teamwork

Educación

Bachelor's Degree in Electrical/Electronics/Computer Engineering

Herramientas

ATE platforms

Test program development

Descripción del empleo

Altera in Penang, Malaysia seeks a Testability and Manufacturing Test Engineer to drive IC testability from feasibility through production ramp. You will develop test flows, validate DFx/DFM features, and collaborate across fab, process development, quality, and manufacturing teams to enable high-yield, scalable production.

Responsibilities include evaluating ATE platforms, performing device characterization, and defining datasheet specifications while reducing test time and costs.