Yield & Defect Metrology Section Manager

Texas Instruments; United States; On-site; USD 120,000 - 170,000; Full time

Job summary

Texas Instruments is seeking an experienced Section Manager, YE/Defect Metrology to lead defect metrology strategies and a team in a high‑volume 300mm wafer fabrication environment.

You will own defectivity reduction, excursion management, and manufacturing process control while engaging site leadership to shape the yield roadmap and drive continuous improvement across TI’s manufacturing network.

Qualifications

• Leadership experience in a manufacturing environment.
• Experience with defect metrology and yield initiatives.
• Ability to drive cross-functional programs and engage site leadership.

Responsibilities

• Lead and grow a team of engineers and technicians for defect metrology and excursion management.
• Drive workforce planning, performance management, and talent development within the section.
• Foster a culture of operational excellence and continuous improvement.
• Define and execute defect control strategies across production tools and technology nodes.
• Lead excursion detection, containment, and root cause analysis in high-volume 300mm fabrication.
• Develop monitoring methods to speed excursion detection and response (MTTD/MTTR).
• Expand automated containment capabilities to reduce manufacturing exposure risk.
• Oversee SPC governance and quality systems for stable processes.
• Standardize manufacturing controls across platforms and ensure ISO/IATF compliance.
• Coordinate defect control with process engineering, operations, and quality teams.
• Brief leadership on defect events, containment actions, and excursion status.
• Present performance reviews and yield improvement roadmaps to site management.
• Champion AI-enabled manufacturing and data-driven decision support for defect analysis.

Skills

Section leadership

Defect metrology

Manufacturing yield improvement

Data-driven decision making

Cross-functional collaboration

Tools

Statistical Process Control (SPC)

Defect metrology tools

Data analytics platforms

Job description

Texas Instruments is seeking an experienced Section Manager, YE/Defect Metrology to lead defect metrology strategies and a team in a high‑volume 300mm wafer fabrication environment.

You will own defectivity reduction, excursion management, and manufacturing process control while engaging site leadership to shape the yield roadmap and drive continuous improvement across TI’s manufacturing network.