Section Manager - YE/Defect Metrology (SM1)

Texas Instruments; United States; On-site; USD 120,000 - 170,000; Full time

Job summary

Texas Instruments is seeking an experienced Section Manager, YE/Defect Metrology to lead defect metrology strategies and a team in a high‑volume 300mm wafer fabrication environment.

You will own defectivity reduction, excursion management, and manufacturing process control while engaging site leadership to shape the yield roadmap and drive continuous improvement across TI’s manufacturing network.

Qualifications

• Leadership experience in a manufacturing environment.
• Experience with defect metrology and yield initiatives.
• Ability to drive cross-functional programs and engage site leadership.

Responsibilities

• Lead and grow a team of engineers and technicians for defect metrology and excursion management.
• Drive workforce planning, performance management, and talent development within the section.
• Foster a culture of operational excellence and continuous improvement.
• Define and execute defect control strategies across production tools and technology nodes.
• Lead excursion detection, containment, and root cause analysis in high-volume 300mm fabrication.
• Develop monitoring methods to speed excursion detection and response (MTTD/MTTR).
• Expand automated containment capabilities to reduce manufacturing exposure risk.
• Oversee SPC governance and quality systems for stable processes.
• Standardize manufacturing controls across platforms and ensure ISO/IATF compliance.
• Coordinate defect control with process engineering, operations, and quality teams.
• Brief leadership on defect events, containment actions, and excursion status.
• Present performance reviews and yield improvement roadmaps to site management.
• Champion AI-enabled manufacturing and data-driven decision support for defect analysis.

Skills

Section leadership

Defect metrology

Manufacturing yield improvement

Data-driven decision making

Cross-functional collaboration

Tools

Statistical Process Control (SPC)

Defect metrology tools

Data analytics platforms

Job description

Why Texas Instruments

At Texas Instruments, we design and manufacture semiconductors that power electronics across the world. Our 300mm manufacturing facilities represent some of the most advanced wafer fabrication environments in the industry. We invest in our people, our technology, and our manufacturing capabilities and we are looking for leaders who want to make a meaningful impact at scale.

About the Role

Texas Instruments is seeking an experienced and results-driven Section Manager, YE/Defect Metrology to join our 300mm semiconductor manufacturing organization. In this leadership role, you will own factory-wide defect metrology strategies, drive yield improvement initiatives, and lead a team of engineers and technicians focused on defectivity reduction, excursion management, and manufacturing process control.

This is a high-visibility position with direct engagement with site leadership. You will play a critical role in shaping the long-term yield roadmap for TI's advanced wafer fabrication environment while building and developing a high-performing engineering team.

What You'll Do

Team Leadership & Organization Management

• Lead, develop, and grow a team of engineers and technicians responsible for factory-wide defect metrology, defectivity reduction, and excursion management
• Drive workforce planning, performance management, succession planning, and talent development within the section
• Foster a culture of operational excellence, accountability, and continuous improvement

Yield Enhancement & Defect Metrology

• Define and execute factory-wide defect control strategies across production tools spanning multiple technology nodes
• Lead excursion detection, containment, and root cause resolution in a high-volume 300mm wafer fabrication environment
• Develop and deploy monitoring methodologies that improve excursion detection speed (MTTD) and accelerate operational response (MTTR)
• Expand automated containment capabilities including auto-inhibit and response systems to reduce manufacturing exposure risk

Process Control & Quality Systems

• Oversee Statistical Process Control (SPC) governance and manufacturing quality systems to ensure sustained process stability
• Drive standardization of manufacturing control methodologies across multiple technology platforms
• Maintain compliance with customer, ISO, IATF, and internal quality audit standards

Cross-Functional Collaboration & Executive Engagement

• Partner with process engineering, integration, operations, equipment engineering, and quality teams to coordinate defect control execution
• Provide operational briefings on significant defect events, containment actions, and excursion status to senior and executive site leadership
• Present factory performance reviews, MTTD/MTTR roadmaps, and yield improvement updates to site management

Digital Transformation & Innovation

• Champion AI-enabled manufacturing and data-driven decision-support initiatives focused on defect analysis and engineering productivity
• Lead and contribute to continuous improvement programs that advance factory-wide yield, quality, and operational performance
• Support cross-site benchmarking and best-practice sharing across TI's global manufacturing network