Section Manager, Defect Metrology & Yield Improvement

Texas Instruments Incorporated; Sherman, Northern (TX, KY); Hybrid; USD 180,000 - 235,000; Full time

Job summary

Texas Instruments Incorporated in Sherman, Texas, is seeking an experienced Section Manager, YE/Defect Metrology to lead factory-wide defect metrology strategies and drive yield improvements.

You will manage a team of engineers and technicians, guide excursion containment, SPC governance, and collaborate with cross-functional teams to advance AI-enabled manufacturing and data-driven decisions.

Responsibilities

• Lead, develop, and grow a team of engineers and technicians responsible for factory-wide defect metrology, defectivity reduction, and excursion management
• Define and execute factory-wide defect control strategies across production tools spanning multiple technology nodes
• Lead excursion detection, containment, and root cause resolution in a high-volume 300mm wafer fabrication environment
• Develop and deploy monitoring methodologies that improve excursion detection speed and accelerate operational response
• Oversee SPC governance and manufacturing quality systems to ensure sustained process stability
• Partner with process engineering, integration, operations, equipment engineering, and quality teams to coordinate defect control execution

Skills

Team leadership

Defect metrology

Data-driven decisions

Cross-functional collaboration

Process improvement

Job description

Texas Instruments Incorporated in Sherman, Texas, is seeking an experienced Section Manager, YE/Defect Metrology to lead factory-wide defect metrology strategies and drive yield improvements.

You will manage a team of engineers and technicians, guide excursion containment, SPC governance, and collaborate with cross-functional teams to advance AI-enabled manufacturing and data-driven decisions.