Section Manager - YE/Defect Metrology (SM1)

Texas Instruments Incorporated; Sherman, Northern (TX, KY); Hybrid; USD 180,000 - 235,000; Full time

Job summary

Texas Instruments Incorporated in Sherman, Texas, is seeking an experienced Section Manager, YE/Defect Metrology to lead factory-wide defect metrology strategies and drive yield improvements.

You will manage a team of engineers and technicians, guide excursion containment, SPC governance, and collaborate with cross-functional teams to advance AI-enabled manufacturing and data-driven decisions.

Responsibilities

• Lead, develop, and grow a team of engineers and technicians responsible for factory-wide defect metrology, defectivity reduction, and excursion management
• Define and execute factory-wide defect control strategies across production tools spanning multiple technology nodes
• Lead excursion detection, containment, and root cause resolution in a high-volume 300mm wafer fabrication environment
• Develop and deploy monitoring methodologies that improve excursion detection speed and accelerate operational response
• Oversee SPC governance and manufacturing quality systems to ensure sustained process stability
• Partner with process engineering, integration, operations, equipment engineering, and quality teams to coordinate defect control execution

Skills

Team leadership

Defect metrology

Data-driven decisions

Cross-functional collaboration

Process improvement

Job description

Why Texas Instruments

At Texas Instruments, we design and manufacture semiconductors that power electronics across the world. Our 300mm manufacturing facilities represent some of the most advanced wafer fabrication environments in the industry. We invest in our people, our technology, and our manufacturing capabilities and we are looking for leaders who want to make a meaningful impact at scale.

About the Role

Texas Instruments is seeking an experienced and results-driven Section Manager, YE/Defect Metrology to join our 300mm semiconductor manufacturing organization. In this leadership role, you will own factory-wide defect metrology strategies, drive yield improvement initiatives, and lead a team of engineers and technicians focused on defectivity reduction, excursion management, and manufacturing process control.

This is a high-visibility position with direct engagement with site leadership. You will play a critical role in shaping the long-term yield roadmap for TI's advanced wafer fabrication environment while building and developing a high-performing engineering team.

What You'll Do

Team Leadership & Organization Management

• Lead, develop, and grow a team of engineers and technicians responsible for factory-wide defect metrology, defectivity reduction, and excursion management
• Drive workforce planning, performance management, succession planning, and talent development within the section
• Foster a culture of operational excellence, accountability, and continuous improvement

Yield Enhancement & Defect Metrology

• Define and execute factory-wide defect control strategies across production tools spanning multiple technology nodes
• Lead excursion detection, containment, and root cause resolution in a high-volume 300mm wafer fabrication environment
• Develop and deploy monitoring methodologies that improve excursion detection speed (MTTD) and accelerate operational response (MTTR)
• Expand automated containment capabilities including auto-inhibit and response systems to reduce manufacturing exposure risk

Process Control & Quality Systems

• Oversee Statistical Process Control (SPC) governance and manufacturing quality systems to ensure sustained process stability
• Drive standardization of manufacturing control methodologies across multiple technology platforms
• Maintain compliance with customer, ISO, IATF, and internal quality audit standards

Cross-Functional Collaboration & Executive Engagement

• Partner with process engineering, integration, operations, equipment engineering, and quality teams to coordinate defect control execution
• Provide operational briefings on significant defect events, containment actions, and excursion status to senior and executive site leadership
• Present factory performance reviews, MTTD/MTTR roadmaps, and yield improvement updates to site management

Digital Transformation & Innovation

• Champion AI-enabled manufacturing and data-driven decision-support initiatives focused on defect analysis and engineering productivity
• Lead and contribute to continuous improvement programs that advance factory-wide yield, quality, and operational performance
• Support cross-site benchmarking and best-practice sharing across TI's global manufacturing network