Senior Electron Microscopy Engineer: Defect & Yield Lead

AOI; Sugar Land (TX); On-site; USD 150,000 - 190,000; Full time

Benefits offered by this job

Flexible health plans

401(k) matching

Generous PTO

Relocation package within US

Immigration sponsorships

Job summary

Applied Optoelectronics, Inc. (AOI) in Sugar Land, TX seeks a Senior Electron Microscopy Engineer to lead advanced microscopy for failure analysis and yield improvement. You will own FIB/SEM/EDX-TEM methods, develop sample-prep techniques, and correlate defects with device processes.

PhD with 5+ years in industry is preferred, with hands-on expertise in plan-view TEM specimens and lamellae. You will supervise lab operations and collaborate across R&D, Yield, and Process teams.

Qualifications

• Ph.D. in Materials Science, Physics, Electrical Engineering, or a related field with 5+ years of relevant industrial experience
• Recognized expertise in advanced electron microscopy including FIB, SEM, EDX/EDS, TEM/STEM, HRTEM, and electron diffraction
• Strong knowledge of crystallography, semiconductor defects, and defect-formation mechanisms

Responsibilities

• Perform advanced electron microscopy analysis using FIB, SEM, EDX/EDS, TEM/STEM, HRTEM, and electron diffraction to identify defects and failure mechanisms.
• Develop advanced FIB sample-preparation methods including plan-view TEM specimens and site-specific cross-sectional lamellae.
• Analyze crystallographic and process-induced defects with emphasis on formation mechanisms and process origins.
• Correlate microscopy results with epitaxy, wafer-fabrication processes, device performance, reliability testing, and yield data.
• Oversee microscopy laboratory operations, equipment performance, and sample-preparation capabilities.
• Develop and maintain SOPs and analytical procedures, and train technicians and engineers in microscopy operation and data interpretation.
• Collaborate with Process Engineering, Epitaxy, Yield, Reliability, Quality, and R&D teams to investigate product failures.
• Work with equipment vendors, universities, and external laboratories to introduce advanced microscopy technologies.
• Prepare technical reports and present analysis results, defect mechanisms, and root-cause conclusions to technical teams and management

Skills

Advanced electron microscopy

Defect analysis

Semiconductor materials knowledge

Education

PhD in Materials Science or related field with 5+ years’ experience

Tools

FIB

SEM

EDX/EDS

TEM/STEM

HRTEM

Electron diffraction

Plan-view TEM specimens

Site-specific cross-sectional lamellae

Job description

Applied Optoelectronics, Inc. (AOI) in Sugar Land, TX seeks a Senior Electron Microscopy Engineer to lead advanced microscopy for failure analysis and yield improvement. You will own FIB/SEM/EDX-TEM methods, develop sample-prep techniques, and correlate defects with device processes.

PhD with 5+ years in industry is preferred, with hands-on expertise in plan-view TEM specimens and lamellae. You will supervise lab operations and collaborate across R&D, Yield, and Process teams.