Semiconductor Defect & Metrology Engineer - Elevate Yield

Applied-Optoelectronics-Inc

Sugar Land (TX)

On-site

USD 90,000 - 130,000

Full time

2 days ago
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Job summary

Applied-Optoelectronics Inc. in Sugar Land, TX seeks a Defect/Metrology Engineer to fabricate compound semiconductor lasers on InP wafers in a cleanroom. You will ensure high tool uptime, analyze process data, and address issues promptly.

You may participate in improvement projects and vendor-driven tool qualification activities. Required: Bachelor’s in EE/Materials/Physics or related field, 1+ year in a lab, strong problem-solving and attention to detail.

Qualifications

  • Bachelor’s degree in Electrical Engineering, Material Science, Physics, or related discipline.
  • Minimum 1-year experience in the laboratory environment.
  • Robust analysis and problem-solving skills.
  • Detail-oriented; committed to quality and safety.
  • Self-sufficient learner in a fast-paced environment.

Responsibilities

  • Maintain production line to reduce downtime and ensure uptime.
  • Analyze defect analysis and process data to drive improvements.
  • Establish or analyze SPC, yield, and tool performance metrics.
  • Create SOPs, work instructions, drawings, and 5S documentation.
  • Analyze equipment data for improvement opportunities and reports.
  • Maintain and calibrate production tools (microscopes, SEM, AFM, etc.).
  • Respond to wafer disposition requests and resume production quickly.

Education

Bachelor’s degree in Electrical Engineering, Material Science, Physics, or related discipline

Job description

Applied-Optoelectronics Inc. in Sugar Land, TX seeks a Defect/Metrology Engineer to fabricate compound semiconductor lasers on InP wafers in a cleanroom. You will ensure high tool uptime, analyze process data, and address issues promptly.

You may participate in improvement projects and vendor-driven tool qualification activities. Required: Bachelor’s in EE/Materials/Physics or related field, 1+ year in a lab, strong problem-solving and attention to detail.

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