Lead Semiconductor Metrology Process Engineer

Coherent Corp.; Sherman (TX); On-site; USD 110,000 - 160,000; Full time

Job summary

Coherent Corp. is seeking a Metrology Development Engineer to own measurement methods for production and process development in a semiconductor environment.

You will create and optimize recipes for ellipsometry, spectroscopy, reflectometry, profilometry, WLI, and Nanospec, and develop methods for film thickness, RI, and surface topography. Collaboration with photo, etch, thin films, and R&D teams is essential.

Qualifications

• Bachelor’s or Master’s degree required in a technical field.
• 5+ years of semiconductor metrology or related experience.
• Experience developing and optimizing metrology in a semiconductor manufacturing environment.
• On-site work in cleanroom environment; off-hours support as needed.
• Strong analytical and communication skills.

Responsibilities

• Own metrology development for production and process development.
• Develop and optimize measurement recipes for ellipsometry, spectroscopy, reflectometry, profilometry, WLI, Nanospec, and other metrology systems.
• Develop measurement methods for film thickness, RI, surface topography, step height, feature dimensions, wafer bow, and other critical process parameters.
• Establish measurement locations, sampling plans, and measurement strategies to ensure data quality.
• Apply SPC, DOE, and statistical analysis to monitor and improve processes.
• Collaborate cross-functionally with photo, etch, thin films, wet process, integration, R&D, and production teams.

Skills

Ellipsometry

Spectroscopy

Reflectometry

Profilometry

WLI

Nanospec

MSA

Gage R&R

SPC

DOE

Statistical analysis

Root cause analysis

Data analysis tools

Education

Bachelor’s or Master’s degree in Materials Science, Electrical Engineering, Chemical Engineering, Physics, or related field

Tools

JMP

Excel

Job description

Coherent Corp. is seeking a Metrology Development Engineer to own measurement methods for production and process development in a semiconductor environment.

You will create and optimize recipes for ellipsometry, spectroscopy, reflectometry, profilometry, WLI, and Nanospec, and develop methods for film thickness, RI, and surface topography. Collaboration with photo, etch, thin films, and R&D teams is essential.