Dual-Beam FIB/SEM Scientist — TEM Lamella & Analysis

Eag-Laboratories; Milpitas (CA); On-site; USD 118,000 - 130,000; Full time

Benefits offered by this job

Medical Insurance

Dental Insurance

Vision Insurance

401k Matching

Wellness Program

Volunteer Time Off

Education Assistance

Fitness Reimbursement

Job summary

Eurofins EAG Laboratories in Milpitas, CA, seeks a Scientist with Dual Beam FIB/SEM expertise to advance microscopy investigations for client samples in semiconductor and materials characterization projects.

The role focuses on TEM lamella prep, FIB-SEM/EDS analysis, automation workflows, data pipelines, and collaboration with cross-functional teams to deliver high-quality analytical results.

Qualifications

• MS or PhD in Materials Science and Engineering or related field.
• In-depth knowledge of electron microscopy; Dual Beam (FIB/SEM) imaging.
• Experience with SEM/EDX or TEM sample preparation.
• Solid understanding of semiconductor device physics and failure analysis.
• Excellent communication skills (written, verbal, presentation).

Responsibilities

• Support FIB/SEM operation, including TEM lamella preparation and FIB-SEM/EDS analysis.
• Develop and implement automation workflows on Dual Beam (FIB/SEM) systems for lamella prep, cross‑sectioning, and imaging.
• Maintain pipelines for FIB sample preparation, SEM imaging, and data acquisition.
• Perform image processing and analysis on 2D/3D FIB/SEM datasets.
• Improve throughput, repeatability, and data quality of Dual Beam services.
• Collaborate with cross‑functional teams to solve failure analysis and materials characterisation challenges.
• Engage with a diverse customer base across multiple industries, providing technical consultation and guidance on analytical approaches and solutions.

Skills

FIB/SEM imaging

TEM lamella preparation

Automation workflows

FIB/SEM/EDS data analysis

Communication skills

Education

MS or PhD in Materials Science and Engineering or related field

Tools

SEM/EDX

TEM lamella preparation

Dual Beam (FIB/SEM) imaging

Job description

Eurofins EAG Laboratories in Milpitas, CA, seeks a Scientist with Dual Beam FIB/SEM expertise to advance microscopy investigations for client samples in semiconductor and materials characterization projects.

The role focuses on TEM lamella prep, FIB-SEM/EDS analysis, automation workflows, data pipelines, and collaboration with cross-functional teams to deliver high-quality analytical results.