Advanced Dual Beam FIB/SEM Imaging Scientist

Eurofins; Milpitas (CA); On-site; USD 118,000 - 130,000; Full time

Benefits offered by this job

Medical, Dental and Vision Insurance

401k Company Matching

Wellness Program

Volunteer Time off

Education Assistance

Fitness Reimbursement

Job summary

Eurofins EAG Laboratories in Milpitas, CA, is seeking a Scientist with expertise in Dual Beam FIB/SEM to join our flagship microscopy team. You will prepare TEM lamellae, perform SEM imaging and EDS analysis on FIB cross-sections, and contribute to detailed structural and failure analyses for semiconductor and materials projects.

This role emphasizes automation workflow development, data quality, and collaboration with cross-functional teams to deliver timely analytical results in a fast-paced

Qualifications

• MS or PhD in Materials Science and Engineering or related field or equivalent industrial experience.
• In-depth knowledge of electron microscopy; Dual Beam (FIB/SEM) imaging.
• Expert with SEM/EDX, or TEM sample preparation.
• Solid understanding of semiconductor device physics and failure analysis.
• Excellent communication skills (written, verbal and presentation).

Responsibilities

• Support FIB/SEM operation, including TEM lamella preparation and FIB-SEM/EDS analysis.
• Develop and implement automation workflows on Dual Beam (FIB/SEM) systems for lamella prep, cross-sectioning, and imaging.
• Maintain pipelines for FIB sample preparation, SEM imaging, and data acquisition.
• Perform image processing and analysis on 2D/3D FIB/SEM datasets.
• Improve throughput, repeatability, and data quality of Dual Beam services.
• Collaborate with cross-functional teams to solve failure analysis and materials characterization challenges.
• Engage with a diverse customer base across multiple industries, providing technical consultation and guidance on analytical approaches and solutions.

Skills

Electron microscopy

FIB/SEM imaging

SEM/EDX

TEM sample preparation

Education

MS or PhD in Materials Science and Engineering or related field

Tools

FIB/SEM systems

TEM lamella preparation

EDS analysis

Job description

Eurofins EAG Laboratories in Milpitas, CA, is seeking a Scientist with expertise in Dual Beam FIB/SEM to join our flagship microscopy team. You will prepare TEM lamellae, perform SEM imaging and EDS analysis on FIB cross-sections, and contribute to detailed structural and failure analyses for semiconductor and materials projects.

This role emphasizes automation workflow development, data quality, and collaboration with cross-functional teams to deliver timely analytical results in a fast-paced