Defect Metrology Lead: Yield & Process Insights

intel; Phoenix (AZ); Presencial; USD 89.000 - 171.000; Jornada completa

Descripción de la vacante

Intel in the United States, Arizona, Phoenix, is seeking a Defect Metrology Layer Owner to drive data-driven improvements across the manufacturing line. You will collaborate with process engineers to minimize defects by enhancing tool capability and process stability, while delivering high-quality analytical insights for rapid yield improvements.

The role requires strong data analysis skills, experience in semiconductor fabrication, and the ability to lead cross-functional teams.

Formación

• Bachelor's degree in Electrical/Mechanical/Materials engineering or related field.
• 2+ years in semiconductor fabrication and processing.
• Experience with SPC, DOE, and statistical data analysis.

Responsabilidades

• Perform detailed data analysis to identify root causes of defect issues.
• Identify exclusionary or baseline defect sources and recommend fixes.
• Lead continuous improvement projects for defect performance.
• Provide expertise on process flow segments and defect analysis.
• Lead cross-area problem solving to reduce defects.

Conocimientos

Statistical data analysis

Python

R

SQL

DOE

SPC

Educación

Bachelor's degree in Electrical/Mechanical/Materials engineering or related field

Master’s degree in related field

Herramientas

JMP/JSL

Descripción del empleo

Intel in the United States, Arizona, Phoenix, is seeking a Defect Metrology Layer Owner to drive data-driven improvements across the manufacturing line. You will collaborate with process engineers to minimize defects by enhancing tool capability and process stability, while delivering high-quality analytical insights for rapid yield improvements.

The role requires strong data analysis skills, experience in semiconductor fabrication, and the ability to lead cross-functional teams.