Defect Metrology Layer Lead: Data-Driven Yield

Intel Corporation; Phoenix (AZ); On-site; USD 89,000 - 171,000; Full time

Benefits offered by this job

Stock bonuses

Health insurance

Retirement plan

Vacation

Job summary

Intel Corporation is seeking highly motivated individuals to sustain, ramp, and transfer technology nodes in Arizona. The role focuses on driving improvements in safety, quality, yield, reliability, cost, and process stability while maintaining strict quality control.

You will work on defect metrology initiatives, leveraging real-time monitoring data to accelerate yield learning cycles and support inline metrology decisions across the manufacturing line.

Qualifications

• Bachelor’s degree in Electrical Engineering or related field; 2+ years experience in semiconductor fabrication or Master’s degree in related field.
• Experience with SPC, DOE, and statistical data analysis.
• Active US Government TS Security Clearance with SCI access preferred or ability to obtain.

Responsibilities

• Perform detailed data analysis to identify root causes of defect issues.
• Identify exclusionary/baseline sources of defects and lead corrective actions.
• Lead/participate in continuous improvement projects for defect performance; provide expertise on process flow segments.

Skills

Data analysis

Statistical methods

Problem solving

Communication

Team collaboration

Education

Bachelor's degree in Electrical Engineering

Master’s degree in related field

Tools

JMP/JSL

Python

R

SQL

Job description

Intel Corporation is seeking highly motivated individuals to sustain, ramp, and transfer technology nodes in Arizona. The role focuses on driving improvements in safety, quality, yield, reliability, cost, and process stability while maintaining strict quality control.

You will work on defect metrology initiatives, leveraging real-time monitoring data to accelerate yield learning cycles and support inline metrology decisions across the manufacturing line.