Defect Metrology Lead - Data-Driven Yield Optimization

Intel Corporation; Chandler (AZ); On-site; USD 89,000 - 171,000; Full time

Benefits offered by this job

Stock bonuses

Health benefits

Vacation

Job summary

Intel Corporation in Phoenix, AZ is seeking a Defect Metrology Layer Owner to drive data-driven improvements in yield and defect reduction on a segment of the manufacturing line. You will work with process engineers to enhance tool and process capability and lead cross-functional problem-solving teams.

The role requires strong analytical skills, teamwork, and the ability to influence across levels. On-site work in Arizona with a competitive compensation package and opportunities to impact

Qualifications

• Bachelor’s Degree in a relevant engineering/science field or related discipline
• 2+ years in semiconductor fabrication and processing OR Master’s degree in related field
• Experience with SPC, DOE, and statistical data analysis

Responsibilities

• Perform detailed data analysis to identify root causes of defect issues
• Identify baseline sources of defects and lead corrective actions
• Lead continuous improvement projects for defect performance

Skills

Data analysis

Problem solving

Interpersonal skills

Communication/presentation

Teamwork/leadership

Analytical mindset

Education

Bachelor’s Degree or higher in Electrical/Mechanical/Materials/Physics/Statistics or related field

Tools

JMP/JSL

Python

R

SQL

Job description

Intel Corporation in Phoenix, AZ is seeking a Defect Metrology Layer Owner to drive data-driven improvements in yield and defect reduction on a segment of the manufacturing line. You will work with process engineers to enhance tool and process capability and lead cross-functional problem-solving teams.

The role requires strong analytical skills, teamwork, and the ability to influence across levels. On-site work in Arizona with a competitive compensation package and opportunities to impact