Test Manufacturing Engineer: Maximize Yield & Cycle Time

Celestica Inc.; Fort Worth (TX); On-site; USD 70,000 - 95,000; Full time

Job summary

Celestica Inc. is seeking an Engineer, Test Manufacturing in Fort Worth, TX to define and optimize test processes and equipment for manufacturing.

The role focuses on improving productivity, cycle time and yield across specific equipment in an Operations value stream. Responsibilities include debugging test processes using DOE and failure analysis, collaborating with Quality and Process engineers, and developing roadmaps to enhance test coverage, diagnosability and OEE.

Qualifications

• Bachelor degree or equivalent combination of education and experience.
• 1 to 3 years of experience preferred.
• Educational Requirements may vary by Geography.

Responsibilities

• Define, specify, qualify, install, support and optimize test processes and equipment for manufacturing.
• Lead test process optimization to improve productivity, cycle time, and yield.
• Debug test processes and equipment using DOE, tools and failure analysis methodologies.
• Collaborate with Quality, Process and Equipment engineers to detect and solve yield and performance issues.
• Develop improvement roadmaps for test coverage, diagnosability, reparability, and test time reductions.

Skills

Test process optimization

Data analysis

Design of experiments

Diagnostics and failure analysis

Cross-functional collaboration

OEE improvement

Education

Bachelor's degree or equivalent

Tools

Manufacturing Execution Systems integration

Job description

Celestica Inc. is seeking an Engineer, Test Manufacturing in Fort Worth, TX to define and optimize test processes and equipment for manufacturing.

The role focuses on improving productivity, cycle time and yield across specific equipment in an Operations value stream. Responsibilities include debugging test processes using DOE and failure analysis, collaborating with Quality and Process engineers, and developing roadmaps to enhance test coverage, diagnosability and OEE.