Staff Reliability Engineer - CMOS NTI/NPI Leader

Samsung Electronics

Austin (TX)

On-site

USD 131,000 - 175,000

Full time

5 days ago

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Benefits offered by this job

Medical insurance

Dental insurance

Vision insurance

401(k) matching

Onsite café and facilities

Paid maternity/paternity leave

Paid time off and holidays

Wellness incentives

Job summary

Samsung Austin Semiconductor in Austin, TX is seeking a Staff Reliability Engineer to drive reliability for NTI/NPI and transition to mass production. The role partners with internal teams, Korea HQ, customers, and the Fab to lead reliability programs across CMOS nodes.

You will apply BEOL reliability degradation mechanisms and lifetime modeling to ensure product integrity and yield. The ideal candidate has a PhD or MS in engineering and 10+ years in semiconductor reliability, with hands-on

Qualifications

MS/PhD in Engineering (preferred Electrical Engineering, Materials Engineering)
10+ years of related experience in Semiconductor reliability engineering
Hands-on experience in Reliability Degradation Mechanisms in BEOL WLR (BEOL TDDB, EM, SM, TC) and maybe in FEOL WLR, as well

Responsibilities

Provide technical leadership to direct a team for reliability improvement activities.
Identify, plan, and execute reliability evaluations for NTI/NPI, technology qualification, process changes and abnormal events; drive improvements with local and overseas operations.
Manage solutions to integration problems across Fab, PIE, Device, Product Test to improve reliability.
Design, execute, and analyze designed experiments to improve semiconductor fabrication processes.
Utilize lessons learned to improve reliability margin; define new process integration for new technology nodes.
Utilize statistical tools and reliability models to extract lifetime from time-to-fail data.
Represent Samsung technology leadership by authoring papers for symposiums and journals and taking leadership roles at external conferences.
Navigate both the industrial and academic landscape to be a knowledge center of device integration and technology development for reliability.
Plus for strong understanding of Semiconductor BEOL Reliability Degradation Mechanisms.