Senior Anti-Tamper Electronics Engineer (DoD)

Serco; Huber Heights (OH); On-site; USD 110,000 - 150,000; Full time

Job summary

Serco Inc. is seeking a Senior Anti-Tamper Engineer (microelectronics) to support the DoD Anti-Tamper Executive Agent Field Program Office at Wright-Patterson AFB, OH. Candidate must hold a Top Secret clearance with SCI access and bring extensive DoD AT experience.

The role focuses on assessing microelectronics, implementing reverse engineering approaches, and collaborating with DoD labs and industry to mitigate vulnerabilities in weapon systems. Travel up to 10% may be required.

Qualifications

• Active DoD Top Secret clearance with SCI access
• ABET-accredited engineering degree with 12+ years DoD/related experience or Master’s with 8+ years
• Minimum 3 years SAP/SCI experience in last 8 years
• Ability to travel up to 10%

Responsibilities

• Assess microelectronics, integrated circuitry, processors, and memory used in military equipment
• Exploit circuitry and memory chips; implement reverse engineering methodologies
• Collaborate with DoD labs and industry to assess susceptibilities of weapon systems
• Improve design, manufacturing, and de-militarization processes for protection of CPI
• Interface with DoD Anti-Tamper teams to evaluate vulnerabilities
• Develop plans to assess CPI susceptibility of GOTS and COTS components

Skills

Top Secret clearance

DoD/AT experience

Reverse engineering

Electrical engineering

Education

ABET-accredited engineering program

Master’s in engineering

Job description

Serco Inc. is seeking a Senior Anti-Tamper Engineer (microelectronics) to support the DoD Anti-Tamper Executive Agent Field Program Office at Wright-Patterson AFB, OH. Candidate must hold a Top Secret clearance with SCI access and bring extensive DoD AT experience.

The role focuses on assessing microelectronics, implementing reverse engineering approaches, and collaborating with DoD labs and industry to mitigate vulnerabilities in weapon systems. Travel up to 10% may be required.