Principal X-Ray Metrology Scientist, Semiconductors

Onto Innovation; Milpitas (CA); On-site; USD 160,000 - 240,000; Full time

Benefits offered by this job

Health, dental, vision coverage

Life and disability insurance

Paid time off (PTO)

401(k) with employer match

Employee Stock Purchase Program (ESPP)

Wellness initiatives

Job summary

Onto Innovation is seeking a highly motivated X-Ray expert to advance metrology solutions for semiconductor manufacturing. You will perform experiments, analyze data, develop models, and create physics-based and ML algorithms for microelectronics characterization.

The role focuses on X-Ray metrology techniques including XRD, XRR, XRF, and especially CD-SAXS, enabling precise structure, composition, and dimensional analysis of complex devices. Travel up to 25% may be required.

Qualifications

• Ph.D. in physics, applied physics, materials science, chemical engineering, or a closely related technical field with a strong academic background in X-Ray science.
• Deep understanding of the physics and instrumentation of advanced X-Ray techniques, with hands-on experience in data analysis for CD-SAXS, XRD, XRR, or XRF.
• Experience conducting X-Ray experiments at a synchrotron, national laboratory, or comparable advanced research facility.
• Experience optimizing experimental methods for throughput, sensitivity, precision, and signal-to-noise performance.
• Experience developing analytical or numerical methods for inverse-problem solving, optimization, parameter estimation, signal processing, and statistical inference.

Responsibilities

• Execute routine alignment and maintenance of X-Ray metrology equipment, develop calibration methods and procedures to maintain measurement accuracy.
• Coordinate and perform data collection on standard reference samples and engineering samples.
• Conduct Gauge R&R testing, qualify tool stability and quantify measurement short- and long-term precision.
• Design and test measurement recipes and optimize collection strategies for high throughput and signal-to-noise ratio.

Skills

Machine learning

Education

PhD in physics or related field

Tools

Python

MATLAB

JMP

Job description

Onto Innovation is seeking a highly motivated X-Ray expert to advance metrology solutions for semiconductor manufacturing. You will perform experiments, analyze data, develop models, and create physics-based and ML algorithms for microelectronics characterization.

The role focuses on X-Ray metrology techniques including XRD, XRR, XRF, and especially CD-SAXS, enabling precise structure, composition, and dimensional analysis of complex devices. Travel up to 25% may be required.