Per Diem CT Technologist — Advanced Imaging Impact

NYU Langone Health; New York (NY); On-site; USD 73,012 - 99,187; Part time

Job summary

NYU Langone Health in New York, NY is seeking a Per Diem CT Technologist to perform radiographic and CT procedures. The role requires accurate interpretation of orders, administration of contrast materials, equipment preparation, and patient positioning to obtain high-quality diagnostic images.

The ideal candidate has an Associate Degree or tech program completion, ARRT CT and radiography certifications, BLS, and state license with NYC area eligibility; experience with HIS/RIS and Siemens

Qualifications

• Associate degree or technical program completion required.
• ARRT CT and Radiography certifications required within specified timelines.
• NYS Radiologic Technologist IV license required within 180 days.
• BLS certification required at hiring.
• Permits and NYS licenses must be maintained during employment.

Responsibilities

• Perform radiographic and CT procedures as prescribed.
• Prepare and operate CT equipment; administer contrast materials.
• Position patients and ensure high-quality diagnostic images.
• Comply with HIPAA, policies, and safety standards.
• Accurately schedule and document exams in HIS/RIS.

Skills

Effective communication

Education

Associate Degree

Technical Program completion

NYS Radiologic Technologist IV License

ARRT Certification in Radiography

ARRT Certification in CT

BLS Certification

Radiologic Technologist Permit (Temporary)

Tools

Siemens experience

Job description

NYU Langone Health in New York, NY is seeking a Per Diem CT Technologist to perform radiographic and CT procedures. The role requires accurate interpretation of orders, administration of contrast materials, equipment preparation, and patient positioning to obtain high-quality diagnostic images.

The ideal candidate has an Associate Degree or tech program completion, ARRT CT and radiography certifications, BLS, and state license with NYC area eligibility; experience with HIS/RIS and Siemens