Dual-Beam FIB/SEM Scientist: Lamella & Imaging

Eurofins | EAG Laboratories; Milpitas (CA); On-site; USD 120,000 - 180,000; Full time

Benefits offered by this job

Medical, Dental and Vision Insurance

401k Company Matching

Wellness Program

Volunteer Time off

Education Assistance

Fitness Reimbursement

Job summary

Eurofins EAG Laboratories in Milpitas, CA is seeking a Scientist with Dual Beam FIB/SEM expertise to advance microscopy investigations for semiconductor and materials characterization. You will prepare TEM lamellae, perform FIB-SEM/EDS analyses, and contribute to CD measurements and data quality improvements.

The role offers a collaborative lab environment, exposure to state-of-the-art instruments, and opportunities to optimize automation workflows while delivering timely results for diverse

Qualifications

• Must have in-depth knowledge of electron microscopy; Dual Beam (FIB/SEM) imaging.
• Expert with SEM/EDX, or TEM sample preparation.
• Solid understanding of semiconductor device physics and failure analysis.
• Excellent communication skills (written, verbal and presentation).
• MS or PhD in Materials Science and Engineering or related field or equivalent industrial experience.

Responsibilities

• Support FIB/SEM operation, including TEM lamella preparation and FIB-SEM/EDS analysis.
• Develop and implement automation workflows on Dual Beam (FIB/SEM) systems for lamella prep, cross-sectioning, and imaging.
• Maintain pipelines for FIB sample preparation, SEM imaging, and data acquisition.
• Perform image processing and analysis on 2D/3D FIB/SEM datasets.
• Improve throughput, repeatability, and data quality of Dual Beam services.
• Collaborate with cross-functional teams to solve failure analysis and materials characterization challenges.
• Engage with a diverse customer base across multiple industries, providing technical consultation and guidance on analytical approaches and solutions.

Skills

FIB/SEM imaging

TEM lamella preparation

SEM/EDX analysis

Automation workflows

Data analysis

Cross-functional collaboration

Excellent communication

Education

MS or PhD in Materials Science and Engineering or related field

Tools

Dual Beam FIB/SEM systems

SEM

TEM sample preparation

Job description

Eurofins EAG Laboratories in Milpitas, CA is seeking a Scientist with Dual Beam FIB/SEM expertise to advance microscopy investigations for semiconductor and materials characterization. You will prepare TEM lamellae, perform FIB-SEM/EDS analyses, and contribute to CD measurements and data quality improvements.

The role offers a collaborative lab environment, exposure to state-of-the-art instruments, and opportunities to optimize automation workflows while delivering timely results for diverse