ATE Test Engineer - IC FA, Equity Eligible

NVIDIA Corporation; Santa Clara (CA); On-site; USD 132,000 - 253,000; Full time

Benefits offered by this job

Equity

Benefits package

Job summary

NVIDIA Corporation in Santa Clara, CA, is seeking a Test Engineer for the Integrated Circuit Defect Analysis (FA) team. You will port and develop test patterns on Advantest V93000 (PS5000) and Teradyne UltraFLEXPlus, converting design data into functional tests to reproduce IC failures.

You will collaborate with FA engineers, design teams, and technicians to optimize test flows, prototype custom load boards and interfaces, and improve diagnostic software performance, enabling faster root-cause

Qualifications

• BS/MS in Electrical Engineering, Computer Engineering, or related field, or equivalent experience.
• 5+ years of hands-on experience with Advantest V93000 (PS5000) and Teradyne UltraFLEXplus (IG-XL software).
• Proficiency with script automation (Python, C++, or Perl) and digital vector processing/debug.
• Familiarity with IC FA flows, failure isolation, electrical fault localization, and yield analysis.

Responsibilities

• Port and develop test vectors, patterns, and software on the Advantest V93000 system (PS5000) and Teradyne UltraFLEXPlus platforms.
• Convert design simulation data into functional, scan, and structural test patterns to reproduce IC failures.
• Collaborate with FA engineers, design teams, and test floor technicians to translate FA steps into reproducible electrical test flows.
• Improve turnaround time by optimizing tester hardware bandwidth, signal integrity, and diagnostic software flows.
• Design, prototype, and validate custom test hardware (load boards, probe cards, DUT interfaces) for FA setups.

Skills

Advantest V93000

Teradyne UltraFLEXplus

Python

C++

Perl

IC FA flows

Education

B.S./M.S. in Electrical Engineering or related field

Tools

SmarTEST 8 environment

IG-XL software

Job description

NVIDIA Corporation in Santa Clara, CA, is seeking a Test Engineer for the Integrated Circuit Defect Analysis (FA) team. You will port and develop test patterns on Advantest V93000 (PS5000) and Teradyne UltraFLEXPlus, converting design data into functional tests to reproduce IC failures.

You will collaborate with FA engineers, design teams, and technicians to optimize test flows, prototype custom load boards and interfaces, and improve diagnostic software performance, enabling faster root-cause