Senior Scientist I, Optics & Imaging Systems, SIMTech

A*STAR Research Entities (A*STAR); Singapore; On-site; SGD 90,000 - 150,000; Full time

Job summary

SIMTech's Optics and Imaging Systems (OIS) Group seeks a scientist to lead R&D on novel X-ray inspection technologies for internal defects in semiconductor packaging. You will drive topics, translate IPs into industrial solutions, and collaborate across disciplines to address industry challenges.

The role requires a PhD in Physics or related fields, publications/patents in X-ray imaging, and a proactive, self-driven mindset to push technology forward in a fast-moving environment.

Qualifications

• PhD with strong publication/patent record in X-ray imaging or related areas.
• Deep understanding of defects detection, metrology and failure analysis in semiconductor manufacturing.
• Experience using scientific software and equipment for detection, analysis and simulation.
• Innovative, self-driven, adaptable team player able to work across disciplines.

Responsibilities

• Lead R&D on novel X-ray inspection technologies, systems and applications.
• Understand industry challenges and propose new topics in X-ray inspection and metrology.
• Translate R&D IPs into novel industrial solutions and semiconductor equipment.
• Collaborate with internal teams and external partners to advance project goals.

Skills

Publications/Patents on X-ray imaging

X-ray imaging expertise

Defects detection & metrology

Software/simulation for defects

Cross-disciplinary teamwork

Industrial R&D collaboration

Education

PhD in Physics or related

Tools

Imaging software

Scientific software

Simulation tools

Job description

The Optics and Imaging Systems (OIS) Group of Singapore Institute of Manufacturing Technology (SIMTech) is seeking a highly self-motivated scientist or senior scientist to drive, initiate, and lead R&D on novel X-ray inspection technologies, systems, and applications for internal defects detection with advanced semiconductor packaging.

The candidate will play a leading role in understanding the challenges that the semiconductor industry is facing today for internal defects inspection, exploring and proposing novel R&D topics on X-ray inspection and metrology technologies, and translating R&D IPs to novel industrial solutions and semiconductor equipment.

Focused areas include, but are not limited to, the following:

• Novel nano-X-ray inspection technology/system for Semiconductor Manufacturing
• Science for X-ray interaction with materials and its impact on X-ray 2D imaging and CT reconstruction
• AI-assisted defects/artefacts detection, classification and prioritization for failure analysis
• Nano X-ray source with smaller focal-spot, longer lifetime and higher brightness
• AI-assisted fast X-ray imaging and reconstruction

Job Requirements

• PhD degree in Physics, Material Inspection and Analysis, or other relevant disciplines
• Candidates with strong publications/patents on high-resolution X-ray imaging, and X-ray and material interaction for semiconductor manufacturing
• Deep understanding to defects detection, metrology and failure analysis in semiconductor manufacturing
• Demonstrate strong ability of using scientific software/equipment for defects detection, analysis and simulation
• Experience on developing X-ray inspection, measurement and analysis solutions for industrial applications, or working with leading R&D institute on X-ray technology development
• Innovative, self-driven, adaptable, and proactive team player with the ability to work across disciplines