Senior Scientist I, Optics & Imaging Systems, SIMTech

A*STAR RESEARCH ENTITIES; Singapore; On-site; SGD 90,000 - 150,000; Full time

Job summary

Singapore Institute of Manufacturing Technology (SIMTech) in Singapore pursues a highly motivated scientist to lead R&D in novel X-ray inspection technologies for internal defects in semiconductor packaging. You will explore industry challenges and drive innovative topics, translating IP into practical industrial solutions.

Key emphasis on high-resolution X-ray imaging, materials interaction, and cross-disciplinary collaboration with leading R&D institutes to advance semiconductor metrology.

Qualifications

• PhD in Physics, Material Inspection and Analysis, or related discipline.
• Publications/patents in high-resolution X-ray imaging and material interaction for semiconductor manufacturing.
• Strong ability to use scientific software/equipment for defects detection and simulation.
• Self-driven, proactive team player with cross-disciplinary collaboration.

Responsibilities

• Lead R&D on novel X-ray inspection technologies, systems and applications for internal defects detection in semiconductor packaging.
• Translate R&D IPs into industrial solutions and semiconductor equipment.
• Work with cross-disciplinary teams to address industry challenges and drive innovation.

Education

PhD in Physics / Materials science

Job description

The Optics and Imaging Systems (OIS) Group of Singapore Institute of Manufacturing Technology (SIMTech) is seeking a highly self-motivated scientist or senior scientist to drive, initiate, and lead R&D on novel X-ray inspection technologies, systems, and applications for internal defects detection with advanced semiconductor packaging.

The candidate will play a leading role in understanding the challenges that the semiconductor industry is facing today for internal defects inspection, exploring and proposing novel R&D topics on X-ray inspection and metrology technologies, and translating R&D IPs to novel industrial solutions and semiconductor equipment.

Focused areas include, but are not limited to, the following:

• Novel nano-X-ray inspection technology/system for Semiconductor Manufacturing
• Science for X-ray interaction with materials and its impact on X-ray 2D imaging and CT reconstruction
• AI-assisted defects/artefacts detection, classification and prioritization for failure analysis
• Nano X-ray source with smaller focal-spot, longer lifetime and higher brightness
• AI-assisted fast X-ray imaging and reconstruction

Job Requirements

• PhD degree in Physics, Material Inspection and Analysis, or other relevant disciplines
• Candidates with strong publications/patents on high-resolution X-ray imaging, and X-ray and material interaction for semiconductor manufacturing
• Deep understanding to defects detection, metrology and failure analysis in semiconductor manufacturing
• Demonstrate strong ability of using scientific software/equipment for defects detection, analysis and simulation
• Experience on developing X-ray inspection, measurement and analysis solutions for industrial applications, or working with leading R&D institute on X-ray technology development
• Innovative, self-driven, adaptable, and proactive team player with the ability to work across disciplines