Senior OCT Photo Metrology Engineer – Yield & Innovation

MICRON SEMICONDUCTOR ASIA OPERATIONS PTE LTD; Singapore; On-site; SGD 180,000 - 260,000; Full time

Job summary

Micron Technology, Inc. in Singapore seeks an OCT CPEE Photo Metrology Principal/Senior Engineer to lead HVM photo/overlay metrology yield, quality, productivity, and cost improvements. You’ll collaborate with global teams and suppliers, define BKM, and drive cross-fab alignment.

The role requires senior expertise in semiconductor photolithography, data-driven problem solving, and strong communication skills, with flexibility for travel and overseas assignments.

Qualifications

• BS/MS/PhD in Electrical Engineering, Physics, Materials Science, Chemical Engineering, or related field.
• 5+ years (Senior) or 8+ years (Principal) experience in semiconductor photolithography in NPI/HVM manufacturing.
• Strong hands-on experience in photo/overlay metrology engineering (yield, quality, productivity, cost improvement).
• Proven experience in solving challenges involving overlay, CDU, metrology, reticle correction, MMM, destack, and yield matching.
• Experience defining and deploying Best Known Methods (BKM) across tools, nodes, or fabs.
• Ability to act as a technical point of contact for blocking issues and lead problem solving involving multiple functions.
• Strong data-driven approach and communication skills; comfortable working with global teams and suppliers; flexibility to business travel and overseas assignment.

Responsibilities

• Lead HVM photo/overlay metrology yield, quality, productivity, and cost improvement initiatives
• Resolve complex photo/overlay metrology issues through data-driven root-cause analysis
• Define and deploy photo/overlay metrology Best Known Methods (BKM) across fabs for HVM and NPI
• Act as the technical point for cross-fab, complex photo/overlay metrology customer concerns
• Drive MOR-POR gap closure and cross-fab/node alignment in collaboration with internal teams and suppliers
• Influence key suppliers and represent OCT in reviews, workshops, and governance forums

Skills

Photo/overlay metrology

Data-driven analysis

Cross-functional collaboration

Travel flexibility

Education

BS/MS/PhD in EE/Physics/Materials/Chemical Eng

Job description

Micron Technology, Inc. in Singapore seeks an OCT CPEE Photo Metrology Principal/Senior Engineer to lead HVM photo/overlay metrology yield, quality, productivity, and cost improvements. You’ll collaborate with global teams and suppliers, define BKM, and drive cross-fab alignment.

The role requires senior expertise in semiconductor photolithography, data-driven problem solving, and strong communication skills, with flexibility for travel and overseas assignments.